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Scanning Probe Studies of Nanoscale Adhesion Between Solids in the Presence of Liquids and Monolayer Films

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Springer Handbook of Nanotechnology

Part of the book series: Springer Handbooks ((SHB))

Abstract

Adhesion between solids is a ubiquitous phenomenon whose importance is magnified at the micrometer and nanometer scales, where the surface-to-volume ratio diverges as we approach the size of a single atom.

Numerous techniques for measuring adhesion at the atomic scale have been developed, but significant limitations exist. Instrumental improvements and reliable quantification are still needed. Recent studies have highlighted the unique and important effect of liquid capillaries, particularly water, at the nanometer scale. The results demonstrate that macroscopic considerations of classic meniscus theory must be modified to take into account new scaling and geometric relationships unique to the nanometer scale. More generally, a molecular scale description of wetting and capillary condensation as it applies to nanoscale interfaces is clearly desirable, but remains an important challenge.

The measurement of adhesion between self-assembled monolayers has proven to be a reliable way to probe the influence of surface chemistry and local environment on adhesion. To date, however, few of these systems have been investigated in detail quantitatively. The molecular origins of adhesion down to the single-bond level still need to be fully investigated. The most recent studies illustrate that, while new information about adhesion in these systems has been revealed, further enhancements of current techniques as well as the development of new methodologies coupled with accurate theoretical modeling are required to adequately tackle these complex measurements.

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Abbreviations

AFM:

atomic force microscopy

JKR:

Johnson–Kendall–Roberts

MEMS:

microelectromechanical system

NEMS:

nanoelectromechanical system

OTS:

octadecyltrichlorosilane

RH:

relative humidity

SAM:

scanning acoustic microscopy

SAM:

self-assembled monolayer

SFA:

surface force apparatus

SFM:

scanning force microscopy

UHV:

ultrahigh vacuum

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Authors and Affiliations

  1. Department of Engineering Physics, University of Wisconsin-Madison, 1500 Engineering Drive, 53706-1687, Madison, WI, USA

    Robert Carpick Prof.

  2. Department of Chemistry, Texas A& M University, PO Box 30012, 77842, College Station, TX, USA

    James Batteas Dr.

  3. MEMS Devices and Reliability Physics Department, Sandia National Laboratories, P.O. Box 5800, 87185-1069, Albuquerque, NM, USA

    Maarten Boer Dr.

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  1. Robert Carpick Prof.
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  2. James Batteas Dr.
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Correspondence to Robert Carpick Prof. , James Batteas Dr. or Maarten Boer Dr. .

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  1. Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM), Ohio State University, 201 W. 19th Avenue, W 390 Scott Laboratory, Ohio 43210-1142, Columbus, OH, USA

    Bharat Bhushan Prof.

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Carpick, R., Batteas, J., Boer, M. (2007). Scanning Probe Studies of Nanoscale Adhesion Between Solids in the Presence of Liquids and Monolayer Films. In: Bhushan, B. (eds) Springer Handbook of Nanotechnology. Springer Handbooks. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-29857-1_32

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