Modern Developments and Applications in Microbeam Analysis. Proceedings of the 8th Workshop of the European Microbeam Analysis Society (EMAS), Chiclana de la Frontera, Spain, May 18–22, 2003 Xavier LlovetFrancesc SalvatGuillaume F. Bastin EditorialNotes 31 March 2004 Pages: 1 - 2
Examination of the Plenum and Deposition Coupon of the Phebus FPT4 Test by Scanning Electron Microscopy and Photoemission Spectroscopy Paul D. W. BottomleyThomas GouderDidier Pellottiero OriginalPaper 08 March 2004 Pages: 3 - 12
Thickness Determination of Ultra-Thin Films on Si Substrates by EPMA Christiani S. CamposMarcos A. Z. VasconcellosFrancesc Salvat OriginalPaper 08 March 2004 Pages: 13 - 17
X-Ray Analysis of Multi-Films for Electrochromic Device Application Hai-Ning CuiShu JiaVasco Teixeira OriginalPaper 16 February 2004 Pages: 19 - 23
Electron Excited M X-Ray Spectra of the Elements 55≤Z≤58 Jan DellithMichael Wendt OriginalPaper 23 February 2004 Pages: 25 - 28
From Substrate to Coating: Micro- and Surface Analysis Techniques for the Development of Steel Products Rik DillenAnn De VytAnnick Dhont OriginalPaper 23 February 2004 Pages: 29 - 39
X-Ray Microanalysis of Real Materials Using Monte Carlo Simulations Raynald GauvinEric Lifshin OriginalPaper 27 February 2004 Pages: 41 - 47
Relaxation of Alkali Glass Exposed to an Electron Beam Ondrej GedeonKarel Jurek OriginalPaper 23 February 2004 Pages: 49 - 52
Characterisation of Sugar Cane Combustion Particles in the Araraquara Region, Southeast Brazil Ricardo H. M. GodoiAna F. L. GodoiRene Van Grieken OriginalPaper 23 February 2004 Pages: 53 - 56
Investigation of Nickel-Based Alloys Exposed to Supercritical Water Environments Wilhelm HabichtNikolaos BoukisEckhard Dinjus OriginalPaper 23 February 2004 Pages: 57 - 62
Composition Modulation in Low Temperature Growth of InGaAs/GaAs System: Influence on Plastic Relaxation Miriam HerreraDavid GonzálezRafael García OriginalPaper 23 February 2004 Pages: 63 - 66
Comparison of Dynamic Simulations with RBS Measurements of Low Energy Ion Implantation of Sb+ into SiO2/Si Substrates Velislava A. IgnatovaVwe WätjenIvan R. Chakarov OriginalPaper 27 February 2004 Pages: 67 - 74
Microcalorimeter Detectors and Low Voltage SEM Microanalysis Edward A. KenikDavid C. JoyDel Redfern OriginalPaper 08 March 2004 Pages: 81 - 85
Investigation of Contemporary Forgeries of Ancient Silver Coins Gunther KraftStefan FlegeHugo M. Ortner OriginalPaper 27 February 2004 Pages: 87 - 90
Detection of Gas Bubble by SIMS in Irradiated Nuclear Fuel Jérôme LamontagneJean NoirotIngrid Roure OriginalPaper 23 February 2004 Pages: 91 - 94
Study on the Chemistry and Structure of (Na(1−x)Bix)(Nb(1−y)Mny)O3 Ceramics by XPS, AES and EPMA Krystyna Ławniczak-JabłońskaIraida N. DemchenkoMarkku Heinonen OriginalPaper 23 February 2004 Pages: 95 - 99
Analytical Electron Microscopy in a Discontinuous Precipitated Cu–In Alloy Gabriel A. LópezPawel ZiębaEric J. Mittemeijer OriginalPaper 08 April 2004 Pages: 101 - 105
Characterization of Interfacial Reactions in Cu/In/Cu Joints Lidia LitynskaJoanna WojewodaEric J. Mittemeijer OriginalPaper 03 March 2004 Pages: 107 - 110
Monte Carlo Simulation of Electron Transport and X-Ray Generation. II. Radiative Processes and Examples in Electron Probe Microanalysis Xavier LlovetFrancesc SalvatJosé M. Fernández-Varea OriginalPaper 27 February 2004 Pages: 111 - 120
Design and Application of a Set of Vitreous Standards for EDS-SEM Microanalysis of Melting Shop Slags Carmen LunaConcepción LloredaAna Gozalbo OriginalPaper 23 February 2004 Pages: 121 - 127
Structural Study of Micro and Nanotubes Synthesized by Rapid Thermal Chemical Vapor Deposition Francisco M. MoralesDavid MéndezRafael García OriginalPaper 23 February 2004 Pages: 129 - 132
Microstructure of Nickel Aluminides Formed in Situ in Aluminium Matrix Composites Anita Olszówka-Myalska OriginalPaper 16 February 2004 Pages: 133 - 137
New SIMS Procedures for the Characterization of a Complex Silicate Matrix, Na3(REE,Th,Ca,U)Si6O15·2.5H2O (Sazhinite), and Comparison with EMPA and SREF Results Luisa OttoliniFernando CámaraBertrand Devouard OriginalPaper 23 February 2004 Pages: 139 - 146
Identification by Electron Probe Microbeam Analysis of Submicron Borides in Joints of Nickel Base Superalloys Céline PascalClaude MerletBernard Boyer OriginalPaper 27 February 2004 Pages: 147 - 151
Study of the Microtexture of Recrystallized Aluminium Henryk Paul OriginalPaper 27 February 2004 Pages: 153 - 158
Phase and Element Contents of the cBN Based Composites as Estimated by XPS Edyta PiskorskaKrystyna Lawniczak-JablonskaMarkku Heinonen OriginalPaper 23 February 2004 Pages: 159 - 163
Crystalline Inclusions Formed in C+N+BF2 Coimplanted on Silicon (111) Arturo PonceFrancisco M. MoralesJuan Piqueras OriginalPaper 23 February 2004 Pages: 165 - 169
Large-Field EBSD Mapping: Application to the Microstructure of a Friction Stir Welding Nugget Jean-Louis PouchouDenis BoivinChristophe Gallais OriginalPaper 03 March 2004 Pages: 171 - 176
Contribution of EBSD to the Understanding of Massive γ Transformation in TiAl Jean-Louis PouchouAnne DenquinAlexandra Ferrini OriginalPaper 03 March 2004 Pages: 177 - 182
EDS X-Ray Investigation of Interdiffusion in Au–Ni Micro- and Nanolayers Anna RakowskaRobert FilipekRenata Bachorczyk OriginalPaper 23 February 2004 Pages: 183 - 186
Depth Profile Analysis on the Nanometer Scale by a Combination of Electron Probe Microanalysis (EPMA) and Focused Ion Beam Specimen Preparation (FIB) Silvia RichterMatthias BückinsJoachim Mayer OriginalPaper 27 February 2004 Pages: 187 - 192
Monte Carlo Simulation of Electron Transport and X-Ray Generation. I. Electron Elastic and Inelastic Scattering Francesc SalvatXavier LlovetJosé M. Fernńndez-Varea OriginalPaper 01 March 2004 Pages: 193 - 202
An EPMA Study on KNbO3 and NaNbO3 Single Crystals – Potential Reference Materials for Quantitative Microanalysis Zoran SamardzžijaSlavko BernikMiran Čeh OriginalPaper 23 February 2004 Pages: 203 - 208
Certified Reference Materials for Micro-Analysis of Carbon and Nitrogen Stuart SaundersPeter KarduckWillem G. Sloof OriginalPaper 08 March 2004 Pages: 209 - 213
Strategy for Applying Microanalytical Techniques Willem G. SloofLars P. H. Jeurgens OriginalPaper 08 March 2004 Pages: 215 - 221
Chemical Characterization of Airborne Particles in St. Martinus Cathedral in Weert, The Netherlands Zoya SpolnikAnna WorobiecRéne Van Grieken OriginalPaper 03 March 2004 Pages: 223 - 227
A Check Total for Validating Standardless and Normalised EDX Analysis at Low kV Peter J. Statham OriginalPaper 27 February 2004 Pages: 229 - 235
SIMS Analysis of Uranium and Actinides in Microparticles of Different Origin Gabriele Tamborini OriginalPaper 23 February 2004 Pages: 237 - 242
Chemical Investigation of Coloured Minerals in Natural Stones of Commercial Interest Gloria VaggelliFilippo OlmiAlessandro Borghi OriginalPaper 08 March 2004 Pages: 249 - 254
Microchemical Analysis and Microstructural Development of Cr-Doped Mullites M. Pilar VillarJosé M. GeraldíaRafael García OriginalPaper 27 February 2004 Pages: 255 - 260
M Spectra of the Rare Earth Elements Measured with an Ultra-Thin Window Si(Li) Detector Michael WendtJan Dellith OriginalPaper 23 February 2004 Pages: 261 - 265
Misfit-Dislocation Induced Surface Morphology of InGaAs/GaAs Heterostructures Oksana YastrubchakTadeusz WosińskiAttila L. Tóth OriginalPaper 23 February 2004 Pages: 267 - 270
The Corrected Value of the Y La Mass Absorption Coefficient in Silicon Michal ZelechowerJoanna GreckaMiroslawa Kepinska OriginalPaper 27 February 2004 Pages: 271 - 273
Microchemical and Microstructural Characterization of the Early Stages of the Discontinuous Precipitation Reaction in Al-22 at.% Zn Alloy Paweł ZiebaDavid B. Williams OriginalPaper 16 February 2004 Pages: 275 - 279
Effect of Different Electron Elastic-Scattering Cross Sections on Inelastic Mean Free Paths Obtained from Elastic-Backscattering Experiments Aleksander JablonskizFrancesc SalvatzCedric J. Powellz OriginalPaper 25 March 2004 Pages: 75 - 80
