The angle-resolved self-ratio technique for surface depth profile investigations by XFS, EMA, XPS and AES Werner H. Gries OriginalPaper Pages: 117 - 135
Three dimensional ultra trace analysis of materials Herbert HutterManfred Grasserbauer OriginalPaper Pages: 137 - 148
Characterization of oxygen precipitates in Czochralski silicon by imaging SIMS Stefan GaraHerbert HutterManfred Grasserbauer OriginalPaper Pages: 149 - 160
Boron implantation in Si: Channeling effects studied by SIMS and simulation Chunsheng TianStefan GaraGerhard Stingeder OriginalPaper Pages: 161 - 169
Influence of surface structure on surface analytical statements Karl Heinz KochDieter SommerDieter Grunenberg OriginalPaper Pages: 171 - 177
On the correlation of implantation defects and implanted species Joachim BollmannHeinz A. KloseAxel Mertens OriginalPaper Pages: 179 - 187
Distribution and thickness of the surface contaminations on STM tungsten tips, studied by AES/SEM and ARXPS Wojciech F. LisowskiAlbert H. J. van den BergArend van Silfhout OriginalPaper Pages: 189 - 196
Analysis of composition and growth mechanisms of oxide scales on high temperature alloys by SNMS, SIMS, and RBS W. J. QuadakkersA. ElschnerH. Nickel OriginalPaper Pages: 197 - 206
Surface analytical investigation of the tritium getter ZrCO after exposure to various gases Heike GlasbrennerHanns Klewe-NebeniusHans Joachim Ache OriginalPaper Pages: 207 - 217
Characterization of metallic layer composites by means of AES/depth profile analysis Susanne Bredendiek-KämperHolger Jenett OriginalPaper Pages: 219 - 225
Plasma erosion for the development of the structure of carbon fiber reinforced carbons Karl KoizlikHelmut HovenHubertus Nickel OriginalPaper Pages: 227 - 233
EXAFS study of mechanically alloyed Ni-Ta powder Ehrenfried ZschechBoris N. NovgorodovHans-Jürgen Ullrich OriginalPaper Pages: 235 - 243
Grain boundary segregation of P and micro-structural changes in 12% Cr-steels Markus MackenbrockHans Jürgen Grabke OriginalPaper Pages: 245 - 255
Radiation analytical material characterization of diamond layers deposited onto tungsten carbide Hans-Jürgen UllrichMatthias SchlaubitzBenno Lux OriginalPaper Pages: 257 - 263
Observation of RHEED intensity variations during ALE-Growth of CdTe-Epilayers Peter JuzaWolfgang FaschingerHelmut Sitter OriginalPaper Pages: 265 - 272
Characterization of high-temperature superconductors by electron microprobe analysis Theodor H. G. Hehenkamp OriginalPaper Pages: 273 - 277
Preparation of VPS and PVD coatings for metallographic and TEM investigations Günter BlockDieter HirschfeldAnnette Pohl OriginalPaper Pages: 279 - 282
Precise determination of the lattice constant of LiF by means of X-ray divergent beam (pseudo Kossel-) technique via computer graphics and multiple intersections Hans-Jürgen UllrichAndreas UhligHans Waltinger OriginalPaper Pages: 283 - 293
Investigations of nitrogen diffusion in austenitic CrNi steels Andrea KühlDietrich BergnerPeter Karduck OriginalPaper Pages: 295 - 302
WDS-EPMA nitrogen profile determination in TiN/Ti diffusion couples using homotypic standard materials W. LengauerJ. BauerP. Ettmayer OriginalPaper Pages: 303 - 310
Laser experiments in a scanning electron microscope Klaus WetzigSiegfried Menzel OriginalPaper Pages: 311 - 318
Basic investigations for laser microanalysis: III. Application of different buffer gases for laser-produced sample plumes Wolfgang SdorraKay Niemax OriginalPaper Pages: 319 - 327
On the determination of low nitrogen concentration gradients in austenitic CrNi(Mo) steels Hans-Jürgen UllrichMatthias SchlaubitzPeter Karduck OriginalPaper Pages: 329 - 335
Determination of nitrogen and carbon in refractory nitrides and carbonitrides by means of Dumas gas chromatography R. TäublerS. BinderP. Ettmayer OriginalPaper Pages: 337 - 343
ICP-AES detection of silicon carbide impurities volatilized in a graphite furnace with the use of carbon tetrachloride vapour Gyula ZárayTibor KántorHubertus Nickel OriginalPaper Pages: 345 - 358
