SERS Measurements of Magnetic Stretching Force-induced Trans-Gauche Conformational Change Takeyoshi GotoHitoshi Watarai Rapid Communications 10 February 2010 Pages: 135 - 136
Conducting Polymer-coated Electrode as a Reference/Counter Electrode in an Organic Phase and Its Application to a Two-electrode Type Thin-layer cell for Voltammetry at the Liquid | Liquid Interface Yumi Yoshidasatoshi YamaguchiKohji Maeda Rapid Communications 10 February 2010 Pages: 137 - 139
Fabrication of a Carbon Sphere-modified Electrode and Sensitive Determination of Cadmium(II) Xiangliang NieWeibing Hu Rapid Communications 10 February 2010 Pages: 141 - 142
Simultaneous Injection-Effective Mixing Analysis of Palladium Norio TeshimaDaisuke NoguchiShoji Motomizu Rapid Communications 10 February 2010 Pages: 143 - 144
Introductory Photoemission Theory Hiroko AraiTakashi Fujikawa Reviews 10 February 2010 Pages: 147 - 154
Determination of Surface Composition by X-ray Photoelectron Spectroscopy Taking into Account Elastic Photoelectron Collisions Aleksander Jablonski Reviews 10 February 2010 Pages: 155 - 164
Surface Excitations in Surface Electron Spectroscopies Studied by Reflection Electron Energy-Loss Spectroscopy and Elastic Peak Electron Spectroscopy Takaharu NagatomiShigeo Tanuma Reviews 10 February 2010 Pages: 165 - 176
Electron Spectroscopy of Corrugated Solid Surfaces J. Zemek Reviews 10 February 2010 Pages: 177 - 186
Appearance Potential Spectroscopy (APS): Old Method, but Applicable to Study of Nano-structures Y. Fukuda Reviews 10 February 2010 Pages: 187 - 197
ISO-Compliant Calibration of Energy and Intensity Scales of Electron Spectrometers Kazuhiro Yoshihara Reviews 10 February 2010 Pages: 199 - 202
Effects of Electron Back-scattering in Observations of Cross-sectioned GaAs/AlAs Superlattice with Auger Electron Spectroscopy Mineharu SuzukiNobuaki UrushiharaJohn S. Hammond Original Papers 10 February 2010 Pages: 203 - 208
Non-Destructive Depth Profiling of the Activated Ti-Zr-V Getter by Means of Excitation Energy Resolved Photoelectron Spectroscopy Jiří PavluchLudomir ZommerYaroslav Polyak OriginalPaper 10 February 2010 Pages: 209 - 215
Electron Spectra Line Shape Analysis of Highly Oriented Pyrolytic Graphite and Nanocrystalline Diamond Beata LesiakJosef ZemekAdam Jóźwik OriginalPaper 10 February 2010 Pages: 217 - 222
Analysis of Ultra-Thin HfO2/SiOn/Si(001): Comparison of Three Different Techniques Kenji KimuraKaoru NakajimaGünther Dollinger OriginalPaper 10 February 2010 Pages: 223 - 226
Development of the Hard-X-ray Angle Resolved X-ray Photoemission Spectrometer for Laboratory Use Masaaki KobataIgor PíšKeisuke Kobayashi OriginalPaper 10 February 2010 Pages: 227 - 232
Contribution of Ni KLL Auger Electrons to the Probing Depth of the Conversion Electron Yield Measurements Shinjiro HayakawaAya TanakaTakeshi Hirokawa OriginalPaper 10 February 2010 Pages: 233 - 237
Remarks on Some Reference Materials for Applications in Elastic Peak Electron Spectroscopy A. JablonskiJ. Zemek OriginalPaper 10 February 2010 Pages: 239 - 246
A Study of the Cascade Auger Process Using a Cluster Calculation Sei FukushimaSatoshi Ota OriginalPaper 10 February 2010 Pages: 247 - 251
The Theoretical Study of Si Core Levels for the Change of Oxidation state Sei FukushimaSatoshi Ota OriginalPaper 10 February 2010 Pages: 253 - 257
A Practical Method for Determining Minimum Detectable Values in Pulse-Counting Measurements Yoichiro FurukawaManabu IwasakiAkihiro Tanaka OriginalPaper 10 February 2010 Pages: 259 - 265
Structure of Ultra-Thin Diamond-Like Carbon Films Grown with Filtered Cathodic Arc on Si(001) Alberto Herrera-GomezYongjian SunRobert M. Wallace OriginalPaper 10 February 2010 Pages: 267 - 272
Evaluation of Outermost Surface Temperature of Silicon Substrates during UV-Excited Ozone Oxidation at Low Temperature Naoto KamedaTetsuya NishiguchiShingo Ichimura OriginalPaper 10 February 2010 Pages: 273 - 276
X-ray Fluorescence Analysis of Cr6+ Component in Mixtures of Cr2O3 and K2CrO4 Tatsunori TochioShusuke SakakuraMichiru Yamashita OriginalPaper 10 February 2010 Pages: 277 - 279
Quantitative Estimation Methods for Concentrations and Layer Thicknesses of Elements Using Edge-jump Ratios of X-ray absorption spectra Takahito Osawa Notes 10 February 2010 Pages: 281 - 284
