1. High-resolution electron microscopy of amorphization of Cu₄ Ti₃

   • D. E. Luzzi
   • M. Meshii

   Articles 31 January 2011 Pages: 617 - 628

2. Detection of a metallic glass layer by x-ray diffraction

   • J. W. McCamy
   • M. J. Godbole
   • D. H. Lowndes

   Articles 31 January 2011 Pages: 629 - 634

3. The influence of applied stress on precipitate shape and stability

   • M. B. Berkenpas
   • William C. Johnson
   • D. E. Laughlin

   Articles 31 January 2011 Pages: 635 - 645

4. Surface segregation in a dilute copper–silver alloy

   • S. W. Bronner
   • P. Wynblatt

   Articles 31 January 2011 Pages: 646 - 651

5. Laser alloying of Cu and Cr

   • J. F. M. Westendorp
   • W. Koelewijn
   • Th.H. de Keijser

   Articles 31 January 2011 Pages: 652 - 660

6. Wear properties of shock-consolidated amorphous and microcrystalline Ni-38 wt % Mo−8 wt % Cr-1. 5 wt % B alloy powders

   • Vreeland Thad Jr.
   • Naresh N. Thadhani
   • Roger K. Nibert

   Articles 31 January 2011 Pages: 661 - 666

7. Microstructure and mechanical properties of synthetic opal: A chemically bonded ceramic

   • Thomas C. Simonton
   • Rustum Roy
   • Else Breval

   Articles 31 January 2011 Pages: 667 - 674

8. Electrical and thermal transport properties of the Y_{1 − x} M_x CrO₃ system

   • W. J. Weber
   • C. W. Griffin
   • J. L. Bates

   Articles 31 January 2011 Pages: 675 - 684

9. Cesium and bromine doping into hexagonal boron nitride

   • M. Sakamoto
   • J. S. Speck
   • M. S. Dresselhaus

   Articles 31 January 2011 Pages: 685 - 692

10. Internal gettering heat treatments and oxygen precipitation in epitaxial silicon wafers

    • W. Wijaranakula
    • P. M. Burke
    • L. Forbes

    Articles 31 January 2011 Pages: 693 - 697

11. Effect of pre- and postepitaxial deposition annealing on oxygen precipitation in silicon

    • W. Wijaranakula
    • P. M. Burke
    • J. H. Matlock

    Articles 31 January 2011 Pages: 698 - 704

12. The diffusion of antimony in heavily doped and n- and p-type silicon

    • R. B. Fair
    • M. L. Manda
    • J. J. Wortman

    Articles 31 January 2011 Pages: 705 - 711

13. Strain measurement in heteroepitaxial layers—Silicon on sapphire

    • Vreeland Thad Jr.

    Articles 31 January 2011 Pages: 712 - 716

14. Effects of low-energy electron bombardment on the surface chemical structure and adhesive properties of polytetrafluoroethylene (PTFE)

    • J. A. Kelber
    • J. W. Rogers Jr.
    • S. J. Ward

    Articles 31 January 2011 Pages: 717 - 723

15. Review: The nucleation of disorder

    • R. W. Cahn
    • W. L. Johnson

    Commentaries and Reviews 31 January 2011 Pages: 724 - 732

16. Erratum: “Electronic transport and microstructure in MoSi₂ thin films” [J. Mater. Res. 1, 493 (1986)]

    • T. L. Martin
    • J. E. Mahan

    Errata 31 January 2011 Pages: 733 - 733