1. Ordering and decomposition in semiconductor alloys

   • José Luís Martins
   • Alex Zunger

   Materials Communications 31 January 2011 Pages: 523 - 526

2. On the kinetics of thermal donor formation in silicon

   • Jeffrey T. Borenstein
   • David Peak
   • James W. Corbett

   Articles 31 January 2011 Pages: 527 - 536

3. The growth of AuGa₂ thin films on GaAs(001) to form chemically unreactive interfaces

   • Jeffrey R. Lince
   • Tsai C. Thomas
   • Williams R. Stanley

   Articles 31 January 2011 Pages: 537 - 542

4. Growth and photoluminescence characterization of ZnSe layers grown on (100)Ge by molecular beam epitaxy

   • R. M. Park
   • H. A. Mar

   Articles 31 January 2011 Pages: 543 - 546

5. Preparation and crystal properties of thin InSb films for highly sensitive magnetoresistance elements

   • Masaaki Isai
   • Toshiaki Fukunaka
   • Masahide Ohshita

   Articles 31 January 2011 Pages: 547 - 551

6. Fabrication process, experimental results, and application for an elemental level vertically intergrated circuit (ELVIC)

   • Tadayoshi Enomoto

   Articles 31 January 2011 Pages: 552 - 559

7. Electron-beam-stimulated processes at CdS surfaces observed by real-time atomic-resolution electron microscopy

   • David J. Smith
   • Daniel J. Ehrlich

   Articles 31 January 2011 Pages: 560 - 563

8. Alpha-recoil damage in zirconolite (CaZrTi₂O₇)

   • G. R. Lumpkin
   • R. C. Ewing
   • B. C. Chakoumakos

   Articles 31 January 2011 Pages: 564 - 576

9. Radiation-induced implantation of polymeric films in metallic substrates

   • M. W. Ferralli
   • M. Luntz

   Articles 31 January 2011 Pages: 577 - 582

10. Factors influencing the stability of the tetragonal form of zirconia

    • Ramachandra Srinivasan
    • Robert De Angelis
    • Burton H. Davis

    Articles 31 January 2011 Pages: 583 - 588

11. The effect of lateral crack growth on the strength of contact flaws in brittle materials

    • Robert F. Cook
    • David H. Roach

    Articles 31 January 2011 Pages: 589 - 600

12. A method for interpreting the data from depth-sensing indentation instruments

    • M. F. Doerner
    • W. D. Nix

    Articles 31 January 2011 Pages: 601 - 609