Machining of transparent materials using an IR and UV nanosecond pulsed laser A. SalleoT. SandsF.Y. Génin Pages: 601 - 608
Electron trapping center and SnO2-doping mechanism of indium tin oxide T. OmataH. FujiwaraN. Ono Pages: 609 - 614
Oxygen-segregation-controlled epitaxy of Y2O3 films on Nb(110) J. HayozM. BovetP. Aebi Pages: 615 - 618
Influence of the growth conditions on the composition of Al nitride films by laser ablation A. BasillaisC. Boulmer-LeborgneJ. Perrière Pages: 619 - 625
Laser ablation and micropatterning of thin TiN coatings T.V. KononenkoS.V. GarnovH.P. Weber Pages: 627 - 631
Thermomechanical properties of amorphous hydrogenated carbon–germanium alloys F.C. MarquesJ. VilcarromeroR.G. Lacerda Pages: 633 - 637
Silver ions adsorbed to self-assembled monolayers of alkanedithiols on gold surfaces form Ag–dithiol–Au multilayer structures W. DengL. YangC. Bai Pages: 639 - 642
Photoluminescence properties of size-selected Si nanocluster films prepared by laser ablation H.-P. WuA. OkanoK. Takayanagi Pages: 643 - 646
A method to pattern Pd over-layers on GdMg films and its application to increase the transmittance of metal hydride optical switches R. ArmitageM. CichE.R. Weber Pages: 647 - 650
Microstructures and photoluminescence of hydrogenated amorphous carbon films produced by using organic hydrocarbon source J. XuW. LiK. Chen Pages: 651 - 655
Chemical, morphological and accumulation phenomena in ultrashort-pulse laser ablation of TiN in air J. BonseH. SturmW. Kautek Pages: 657 - 665
Sol-gel-derived pyroelectric barium strontium titanate thin films for infrared detector applications J.-G. ChengJ. TangJ.-H. Chu Pages: 667 - 670
Angular laser cleaning for effective removal of particles. from a solid surface J.M. LeeK.G. WatkinsW.M. Steen Pages: 671 - 674
Microstructural investigations of Y2O3 thin films deposited by laser ablation on MgO R.J. GaboriaudF. PaillouxA. Huignard Pages: 675 - 680
Novel template-based semiconductor nanostructures and their applications B. DasS.P. McGinnis Pages: 681 - 688
2.0-MeV Er+ implanted in silicon: depth distribution, damage profile and annealing behaviour Y. LiC. TanP. Liu Pages: 689 - 693
Impedance spectroscopic study of Si/HF-electrolyte system during Si dissolution B.K. PatelS.N. Sahu Pages: 695 - 700