Dynamical friction coefficient maps using a scanning force and friction microscope M. LabardiM. AllegriniC. Ascoli Scanning Probe Methods in Materials Science. Part I Pages: 3 - 10
Scanning and friction-force microscopy of thin C60 films on GeS(001) W. AllersU. D. SchwarzR. Wiesendanger Scanning Probe Methods in Materials Science. Part I Pages: 11 - 15
Investigation of heteroepitaxial diamond films by atomic force and scanning tunneling microscopy K. SchiffmannX. Jiang Scanning Probe Methods in Materials Science. Part I Pages: 17 - 22
Study of the influence of native oxide layers on atomic force microscopy imaging of semiconductor surfaces H. BluhmU. D. SchwarzP. Paufler Scanning Probe Methods in Materials Science. Part I Pages: 23 - 27
Ultrathin-film hardness investigations by a modified atomic force microscope G. PerschCh. BornB. Utesch Scanning Probe Methods in Materials Science. Part I Pages: 29 - 32
Investigation of precipitated colloidal particles by scanning force microscopy: silver-halide microcrystals U. D. SchwarzH. Haefke Scanning Probe Methods in Materials Science. Part I Pages: 33 - 40
Scanning probe microscopy on superconductors: Achievements and challenges U. Hartmann Scanning Probe Methods in Materials Science. Part I Pages: 41 - 48
Observation of the early stages of growth and the formation of growth spirals in epitaxial YBa2Cu3O7-δ thin films by AFM J. BurgerM. LippertG. Saemann-Ischenko Scanning Probe Methods in Materials Science. Part I Pages: 49 - 56
Growth stages of YSZ-buffer layers and YBa2Cu3O7−x thin films on silicon substrates studied by scanning probe microscopy M. LöhndorfF. GoerkeR. Wiesendanger Scanning Probe Methods in Materials Science. Part I Pages: 57 - 62
Recent results in magnetic force microscopy A. WadasP. RiceJ. Moreland Scanning Probe Methods in Materials Science. Part I Pages: 63 - 67
Time-resolved emission spectroscopy of gadolinium vanadate ceramics (GdVO4:Bi3+) J. LeppertS. PeudenierG. Blasse Regular Papers Pages: 69 - 72
Pulsed 532 nm laser wirestripping: Removal of dye-doped polyurethane insulation J. BrannonC. Snyder Regular Papers Pages: 73 - 78
Sub-picosecond UV-laser ablation of Ni films S. PreussE. MatthiasM. Stuke Rapid Communication Pages: 79 - 82
Measurement of the elastic properties of evaporated C60 films by surface acoustic waves H. CoufalK. MeyerP. Hess Rapid Communication Pages: 83 - 86