Editorial Klaus LischkaErnest J. Fantner High-Resolution X-Ray Characterization Of Materials Pages: 119 - 120
High-resolution diffraction-space mapping and topography P. F. Fewster High-Resolution X-Ray Characterization Of Materials Pages: 121 - 127
Determination of strain in epitaxial semiconductor structures by high-resolution X-ray diffraction P. van der Sluis High-Resolution X-Ray Characterization Of Materials Pages: 129 - 134
Practical interpretation of X-ray rocking curves from semiconductor heteroepitaxial layers M. A. G. Halliwell High-Resolution X-Ray Characterization Of Materials Pages: 135 - 140
Analysis of ion-implanted silicon using high-resolution X-ray diffraction A. Pesek High-Resolution X-Ray Characterization Of Materials Pages: 141 - 147
High-resolution X-ray topography R. Köhler High-Resolution X-Ray Characterization Of Materials Pages: 149 - 157
X-ray and neutron reflectivity analysis of thin films and superlattices H. Zabel High-Resolution X-Ray Characterization Of Materials Pages: 159 - 168
The profile of layered materials reflected by glancing-incidence X-ray analysis D. K. G. de BoerA. J. G. LeenaersW. W. van den Hoogenhof High-Resolution X-Ray Characterization Of Materials Pages: 169 - 172
Diffuse X-ray scattering from non-ideal periodical crystalline multilayers V. Holý High-Resolution X-Ray Characterization Of Materials Pages: 173 - 180
Infrared holographic recording in LiNbO3:Cu K. BuseF. JermannE. Krätzig Solids And Materials Pages: 191 - 195
Temperature-induced rearrangement of the dislocation pattern of Persistent Slip Bands in copper single crystals U. HolzwarthU. Essmann Solids And Materials Pages: 197 - 210
Direct writing and in-situ material processing by a laser-micromachining projection microscope K. OsvayZ. BorJ. Heitz Surfaces And Multilayers Pages: 211 - 214
Compensation of temperature drift in leaky-mode spectra for sensor applications M. OsterfeldH. FrankeA. Brandenburg Surfaces And Multilayers Pages: 215 - 218
Photoreflectance characterization of CdTe thin films grown by Molecular Beam Epitaxy on GaAs(100) M. Meléndez-LiraI. Hernández-CalderónH. Höchst Surfaces And Multilayers Pages: 219 - 222
The properties of boron carbide/silicon heterojunction diodes fabricated by Plasma-Enhanced Chemical Vapor Deposition Sunwoo LeeP. A. Dowben Surfaces And Multilayers Pages: 223 - 227