1. Surface analysis and surface measuring techniques in firearm offences

   • H. W. Wenz
   • W. J. Lichtenberg
   • H. Katterwe

   Part II Pages: 155 - 165

2. Raman-microanalysis of strain and crystal orientation in laser-crystallized silicon

   • G. Kolb
   • Th. Salbert
   • G. Abstreiter

   Part II Pages: 166 - 170

3. Peculiarities of AES-depth profiling results from multilayered X-ray monochromators

   • J. Klosowski
   • H. Mai
   • S. Völlmar

   Part II Pages: 171 - 175

4. Growth and characterization of Si/Sb superlattices

   • H. Jorke
   • H. -J. Herzog
   • H. Kibbel

   Part II Pages: 176 - 179

5. Application of the two-dimensional lateral microanalysis by SIMS and EPMA in materials research

   • S. Oswald
   • L. Siegert
   • G. Große

   Part II Pages: 180 - 183

6. Scanning tunneling microscopy of lead selenide monocrystals and epitaxial layers on barium fluoride

   • W. Stocker
   • S. N. Magonov
   • M. Tacke

   Part II Pages: 184 - 188

7. A fully computer controlled, low cost STM

   • M. Wenzel
   • M. Ehinger
   • G. Landwehr

   Part II Pages: 189 - 192

8. A fully computerized modular scanning tunneling microscope system

   • Th. Fries
   • C. Becker
   • K. Wandelt

   Part II Pages: 193 - 195

9. Characterization of tungsten tips for STM by SEM/AES/XPS

   • W. Lisowski
   • A. H. J. van den Berg
   • L. J. Hanekamp

   Part II Pages: 196 - 199

10. AES and XPS investigations for the topochemical characterization of dope elements on WC powders

    • A. Baalmann
    • V. Schlett

    Part II Pages: 200 - 206

11. Detection of particulate polycyclic aromatic hydrocarbons by laser-induced time-resolved fluorescence

    • Reinhard Niessner
    • Wilfried Robers
    • Andreas Krupp

    Part II Pages: 207 - 213

12. SIMS for hydrogen quantification and structural analysis of amorphous silicon germanium compounds

    • A. Eicke
    • G. Bilger

    Part II Pages: 214 - 218

13. SIMS and AES measurements on the LaNi₅-hydrogen system

    • H. Züchner
    • R. Dobrileit
    • T. Rauf

    Part II Pages: 219 - 223

14. The application of surface analytical techniques to silicon technology

    • M. G. Dowsett

    Part II Pages: 224 - 234

15. Surface analysis of functional layers for semiconductor production

    • A. Naoumidis
    • K. Brennfleck

    Part II Pages: 235 - 240

16. Approaches for quantitative Auger electron spectroscopy of silicon after high dose nickel implantation

    • A. Schönborn
    • H. Bubert
    • E. H. te Kaat

    Part II Pages: 241 - 244

17. Dose determination of nickel implantations in silicon wafers

    • H. Bubert
    • P. Burba
    • M. Wielunski

    Part II Pages: 245 - 247

18. Studies of GaAs surface roughness and organic masks resistance depending on the ion-beam energy

    • B. Walkow
    • H. W. Loeb
    • C. Mößner

    Part II Pages: 248 - 250

19. Measurement of the electric potential in silicon solar cells employing an electron-beam tester

    • H. Schmoranzer
    • A. Mayer
    • A. Jank

    Part II Pages: 251 - 254

20. Charge effects during surface analysis of poorly conducting inorganic materials

    • G. Borchardt
    • S. Scherrer
    • S. Weber

    Part II Pages: 255 - 259

21. Analysis of ionic solids with SNMS

    • U. C. Schmidt
    • M. Fichtner
    • H. J. Ache

    Part II Pages: 260 - 264

22. Comparative bulk, surface and depth profile analyses on AlN and SiC-coated B₄C powders

    • H. Jenett
    • E. Grallath
    • P. Kennis

    Part II Pages: 265 - 271

23. Novel optical techniques for the analysis of polymer surfaces and thin films

    • W. Knoll
    • W. Hickel
    • H. Knobloch

    Part II Pages: 272 - 278

24. Observation of spectral interferences for the determination of volume and surface effects of thin films

    • G. Gauglitz
    • W. Nahm

    Part II Pages: 279 - 283

25. X-ray and neutron reflectometry for the investigation of polymer diffusion

    • G. Reiter
    • S. Hüttenbach
    • M. Stamm

    Part II Pages: 284 - 288

26. CEMS/XPS study of iron stearate Langmuir-Blodgett layers

    • W. Meisel
    • P. Tippmann-Krayer
    • P. Gütlich

    Part II Pages: 289 - 291

27. Stoichiometric and structural analyses of thin high-T_c superconducting Bi-Sr-Ca-Cu-O films on silicon

    • M. Lorenz
    • H. -K. Bothe
    • H. -J. Dietze

    Part II Pages: 292 - 295

28. Photoemission studies of BaPb_1−xBi_xO₃ and Ba_1−yK_yBiO₃ crystals

    • A. Winiarski
    • G. Wübbeler
    • M. Neumann

    Part II Pages: 296 - 300

29. Characterization of sputter-deposited YBaCuO films by X-ray photoelectron spectroscopy

    • H. Behner
    • G. Gieres
    • B. Sipos

    Part II Pages: 301 - 307

30. Interface analysis of the system Si/YBa₂Cu₃O_7−x

    • C. Ziegler
    • F. Baudenbacher
    • W. Göpel

    Part II Pages: 308 - 313