Summary
The development of AIII–BV semiconductor surfaces exposed to ion-beam irradiation in the ion energy range from 100 to 1000 eV and the ion current density of 1 mA/cm2 (max) is investigated. The ion-beam etching with an ion energy of 1 keV results in sharp cones and needles on the semiconductor surface due to the surface contamination and unevenness. Etching with ion-beam energies in the order of 300 eV and with etch rates higher than 1000 Å/min produces relatively even GaAs surfaces. In case of reactive gases (i.e. CCl2F2 and the mixture of CCl2F2+Ar) ion-beam etching results in significantly higher etch rates; however, the mask residue contains Cl and F. In studies on the ion-beam resistance of organic masks selectivities as high as 13:1 for the photoresist CM-79 with an ion energy of 180 eV and an ion current density of approximately 0.3 mA/cm2 were achieved.
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Walkow, B., Loeb, H.W., Freisinger, J. et al. Studies of GaAs surface roughness and organic masks resistance depending on the ion-beam energy. Fresenius J Anal Chem 341, 248–250 (1991). https://doi.org/10.1007/BF00321557
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DOI: https://doi.org/10.1007/BF00321557