Injection System for the Siberian Ring Source of Photons S. M. GurovV. N. VolkovA. E. Levichev OriginalPaper 25 August 2020 Pages: 651 - 654
Double- and Triple-Crystal X-Ray Diffraction Analysis of Face-Grown Gd3Ga3Al2O12:Ce Crystals I. A. EliovichV. I. AkkuratovM. V. Kovalchuk OriginalPaper 25 August 2020 Pages: 655 - 659
Superprotonics: New Materials for Energy-Efficient Technologies V. V. GrebenevI. P. MakarovaI. S. Timakov OriginalPaper 25 August 2020 Pages: 660 - 662
Synthesis, Microstructure, Dielectric and Ferroelectric Properties of (Na,Bi,K)TiO3 Ceramics G. M. KalevaE. D. PolitovaB. A. Loginov OriginalPaper 25 August 2020 Pages: 663 - 667
Nanocarbon in the Structure of a Hypereutectic Aluminum-Matrix Composite A. S. AroninI. M. AristovaV. N. Mironenko OriginalPaper 25 August 2020 Pages: 668 - 672
The Structure of Bismuth-Ferrite Hybrid Materials Obtained via Transient Electrolysis A. V. KhramenkovaD. N. AriskinaO. E. Polozhentsev OriginalPaper 25 August 2020 Pages: 673 - 678
Cadmium Whisker Microcrystals on the Surface of Niobium–Cadmium Films V. N. VolodinYu. Zh. TuleushevA. S. Kerimshe OriginalPaper 25 August 2020 Pages: 679 - 683
On the Plasma-Electrolytic Formation of Porous Films of Titanium Oxide M. Yu. Makhmud-AkhunovA. A. Adamovich OriginalPaper 25 August 2020 Pages: 684 - 690
Effect of the Preliminary Heat Treatment of Chlorinated Polyvinyl Chloride on the Formation of Carbon Nanofibers on its Surface under High-Power Ion-Beam Irradiation V. S. KovivchakA. B. ArbuzovM. V. Trenikhin OriginalPaper 25 August 2020 Pages: 691 - 695
A Study of the Surface Morphology of Microfiltration Membranes of the MFFK and MPS Brands by Atomic-Force- and Scanning-Electron Microscopy S. V. KovalevS. I. LazarevO. A. Kovaleva OriginalPaper 25 August 2020 Pages: 696 - 705
Influence of the Ordering of a Binary Alloy on the Emission of its Components K. A. TolpinK. F. MinnibaevV. E. Yurasova OriginalPaper 25 August 2020 Pages: 706 - 712
On Modeling the Distributions of Minority Charge Carriers Generated by a Wide Electronic Beam in Planar Multilayer Semiconductor Structures E. V. SereginaV. V. KalmanovichM. A. Stepovich OriginalPaper 25 August 2020 Pages: 713 - 717
Localization of Small Impurities of Water and Carbon Dioxide in Channels of the Structure of Natural Cordierite A. P. DudkaM. A. BelyanchikovB. P. Gorshunov OriginalPaper 25 August 2020 Pages: 718 - 721
Controlling Properties of Interfaces in Nonlinear Sandwich-Type Structures with a Defocusing Internal Layer S. E. Savotchenko OriginalPaper 25 August 2020 Pages: 722 - 726
Influence of Quenched Non-Magnetic Impurities on Phase Transitions in Low-Dimensional Potts Models A. K. MurtazaevA. B. Babaev OriginalPaper 25 August 2020 Pages: 727 - 729
Analysis of Confidence Intervals for Regression Model Parameters, Based on the Fowler–Nordheim Law N. V. EgorovA. Yu. AntonovM. I. Varayun’ OriginalPaper 25 August 2020 Pages: 730 - 737
Reflection of Hydrogen Isotopes and Helium Atoms from the Surface of the First Wall of the ITER Tokamak D. S. MeluzovaP. Yu. BabenkoA. N. Zinoviev OriginalPaper 25 August 2020 Pages: 738 - 742
Evolution of the Energy and Angular Distributions of Emitted Atoms with a Variation in the Atomic Number of the Target Substance V. N. SamoilovA. I. Musin OriginalPaper 25 August 2020 Pages: 743 - 750
Penetration of a Vortex Lattice into the Bulk of a Liquid S. V. FilatovA. A. Levchenko OriginalPaper 25 August 2020 Pages: 751 - 755
New Approach for Time-Resolved Reciprocal Space Mapping with Adaptive X-Ray Optics I. A. EliovichV. I. AkkuratovM. V. Kovalchuk OriginalPaper 25 August 2020 Pages: 756 - 761
Flints as Nanostructured Chalcedonies R. V. GaynutdinovV. V. VoronovP. P. Fedorov OriginalPaper 25 August 2020 Pages: 762 - 770
Effect of Bismuth on the Structural Perfection of Elastically Strained AlGaInSbBi Epitaxial Layers Grown on InSb Substrates D. L. AlfimovaM. L. LuninaA. N. Yatsenko OriginalPaper 25 August 2020 Pages: 771 - 776
The Influence of Low-Energy Ion-Plasma Treatment on the Surface Morphology of Pt Films with Varying Strength of Crystalline Texture R. V. SelyukovM. O. IzyumovV. V. Naumov OriginalPaper 25 August 2020 Pages: 777 - 783
Angular Dependences of Silicon Sputtering by Gallium Focused Ion Beam V. I. BachurinI. V. ZhuravlevA. B. Churilov OriginalPaper 25 August 2020 Pages: 784 - 790
Some Features of the Electron Exchange between Ions and a Metal Surface Caused by its Atomic Structure A. F. AleksandrovI. K. GainullinM. A. Sonkin OriginalPaper 25 August 2020 Pages: 791 - 797
Precision Measurements of the Intensity in the Electron Diffraction Analysis A. K. KuliginA. S. Avilov OriginalPaper 25 August 2020 Pages: 798 - 802
Study of Secondary Ion Emission in the “Thermal Spike” Mode Yu. KudryavtsevI. GuerreroR. Asomoza OriginalPaper 25 August 2020 Pages: 803 - 807
Molecular-Dynamics Simulation of Silicon Irradiation with Low-Energy Noble Gas Ions A. A. SychevaE. N. Voronina OriginalPaper 25 August 2020 Pages: 808 - 815
Theoretical Explanation of the Effect of a Decrease in the Si(111) Plasmon Energy during the Implantation of Ions with a Large Dose A. S. RysbaevJ. B. KhujaniyozovS. T. Abraeva OriginalPaper 25 August 2020 Pages: 816 - 822
Radiation Defects Induced by Proton Exposure in Hollow Zinc-Oxide Particles A. N. DudinV. V. NeshchimenkoV. Yu. Yurina OriginalPaper 25 August 2020 Pages: 823 - 829
Microscopic and X-Ray Analysis of the Surface Changes in Aluminum Alloys during Friction O. O. ShcherbakovaT. I. MuravyevaD. L. Zagorskiy OriginalPaper 25 August 2020 Pages: 830 - 840
Potential Energy of Atom—Atom Interaction Taking Into Account the Pauli Principle V. P. KoshcheevYu. N. Shtanov OriginalPaper 25 August 2020 Pages: 841 - 845
Portable Hardness Tester for Instrumental Indentation E. V. GladkikhI. I. MaslenikovA. S. Useinov OriginalPaper 25 August 2020 Pages: 846 - 850
α-FeSi2 as a Buffer Layer for β-FeSi2 Growth: Analysis of Orientation Relationships in Silicide/Silicon, Silicide/Silicide Heterointerfaces I. A. TarasovI. A. BondarevA. I. Romanenko OriginalPaper 25 August 2020 Pages: 851 - 861
Method for Manufacturing Silicon X-Ray Masks Via Plasma Chemical Etching A. N. GentselevF. N. DultsevK. E. Kuper OriginalPaper 25 August 2020 Pages: 862 - 865
