Temperature, injection level, and frequency dependences of some extrinsic luminescence bands in ZnTe C. B. Norris OriginalPaper Pages: 733 - 748
Contamination of silicon and oxidized silicon wafers during plasma etching S. P. MurarkaC. J. Mogab OriginalPaper Pages: 763 - 779
Observation of unequal densities for sulfur defects in silicon predeposited by low fluence ion implantation* D. R. MyersW. E. Phillips OriginalPaper Pages: 781 - 788
Electronic properties of chalcogenide glasses and their use in xerography G. Pfister+ OriginalPaper Pages: 789 - 837
Filamentary AC electroluminescence in ZnS:Mn W. Rühle*V. MarrelloA. Onton OriginalPaper Pages: 839 - 853
Megasonic cleaning: A new cleaning and drying system for use in semiconductor processing A. MayerS. Shwartzman OriginalPaper Pages: 855 - 864
Photoconductivity analysis of chromium and oxygen-related levels in semi-insulating GaAs T. OkumuraY. ItohT. Ikoma OriginalPaper Pages: 865 - 877
Physical and electrical characterization of co-deposited Zns:Mn electroluminescent thin film structures J. M. HurdC. N. King OriginalPaper Pages: 879 - 891