Influence of Holes Capture Efficiency on Photoluminescence Temperature Dependence of n-AlGaAs/GaAs Quantum-Well Structures N. G. YaremenkoV. A. StrakhovM. V. Karachevtseva BASIC RESEARCH 09 January 2020 Pages: 1975 - 1978
Determination of the Bulk Conductivity of III–V Semiconductors in a Strong Constant Electric Field and under Harmonic Effects I. V. MalyshevK. A. FilO. A. Goncharova BASIC RESEARCH 09 January 2020 Pages: 1979 - 1982
State of the Surface of Polycrystalline Silver after Exposure to Activated Oxygen O. G. AshkhotovS. A. KhubezhovI. B. Ashkhotova ELECTRONICS MATERIALS 09 January 2020 Pages: 1983 - 1985
Electron Microscopy Study of Silver Nanoparticles Obtained by Thermal Evaporation Ya. S. GrishinaN. I. BorgardtA. I. Savitskiy ELECTRONICS MATERIALS 09 January 2020 Pages: 1986 - 1991
Dependence of the Surface Morphology and Structure of CuIn0.95Ga0.05Se2 Films on the Selenization Temperature T. M. GadzhievM. A. AlievZ. V. Shomakhov ELECTRONICS MATERIALS 09 January 2020 Pages: 1992 - 1998
Optical Properties of Composite Materials Based on Poly[2-methoxy-5-(2-ethylhexyloxy)-1,4-Phenylenevinylene] and Titanium Dioxide in the Mid-IR Spectral Range I. A. BelogorokhovL. I. Belogorokhova ELECTRONICS MATERIALS 09 January 2020 Pages: 1999 - 2001
Mathematical Model of the Evaporation of Amalgam Components in Discharge Radiation Sources N. Yu. PetrenkoS. V. PuchninaS. A. Gavrilov TECHNOLOGICAL PROCESSES AND ROUTES 09 January 2020 Pages: 2002 - 2006
Predicting the Conditions for the Vapor-Phase Epitaxy of the III–V Compounds E. N. Vigdorovich TECHNOLOGICAL PROCESSES AND ROUTES 09 January 2020 Pages: 2007 - 2011
Influence of the Metallization Composition and Annealing Process Parameters on the Resistance of Ohmic Contacts to n-type 6H-SiC V. I. EgorkinV. E. ZemlyakovV. I. Garmash TECHNOLOGICAL PROCESSES AND ROUTES 09 January 2020 Pages: 2012 - 2015
Investigation of the Initial Silicon-on-Sapphire Layer Formed by CVD Techniques S. D. FedotovE. M. SokolovS. P. Timoshenkov TECHNOLOGICAL PROCESSES AND ROUTES 09 January 2020 Pages: 2016 - 2023
Study of the Formation Process of Memristor Structures Based on Copper Sulfide A. N. BelovA. A. GolishnikovV. I. Shevyakov TECHNOLOGICAL PROCESSES AND ROUTES 09 January 2020 Pages: 2024 - 2028
Precession of Magnetization of a Spin-Valve Free Layer and Its Switching under the Effect of a Magnetic Field Perpendicular to the Anisotropy Axis Iu. A. Iusipova ELEMENTS OF INTEGRATED ELECTRONICS 09 January 2020 Pages: 2029 - 2036
Field-Emission Cathodes Based on Microchannel Plates Z. M. KhamdokhovZ. Ch. MargushevM. D. Bavizhev ELEMENTS OF INTEGRATED ELECTRONICS 09 January 2020 Pages: 2037 - 2039
Investigation of the Temperature Effect on the Output Parameters of Radioisotope Sources of Electricity Based on Double Energy Conversion of Radiative Decay S. G. NovikovA. V. BerintsevV. V. Svetukhin ELEMENTS OF INTEGRATED ELECTRONICS 09 January 2020 Pages: 2040 - 2043