1. Electrophysical Parameters and Emission Spectra of the Glow Discharge of Difluorodichloromethane

   • D. B. Murin
   • I. A. Chesnokov
   • A. E. Grishkov

   OriginalPaper 01 November 2023 Pages: 337 - 343

   

2. Protective Free-Standing Films for Projection Lithography Installations in the Extreme UV Range

   • S. Yu. Zuev
   • A. Ya. Lopatin
   • N. I. Chkhalo

   OriginalPaper 01 November 2023 Pages: 344 - 355

   

3. Simulation of the Effect of Lattice Defects on the Work of Joined Materials Separation

   • T. M. Makhviladze
   • M. E. Sarychev

   OriginalPaper 01 November 2023 Pages: 356 - 362

4. A Computer Investigation of the Effect of High-Resistance Layer Inhomogeneities on Resistive Switching in a Bismuth Selenide Microcrystal Structure

   • V. V. Sirotkin

   OriginalPaper 01 November 2023 Pages: 363 - 371

   

5. The Influence of Small F₂, H₂, and HF Additives on the Concentration of Active Particles in Tetrafluoromethane Plasma

   • A. M. Efremov
   • S. A. Smirnov
   • V. B. Betelin

   OriginalPaper 01 November 2023 Pages: 372 - 378

   

6. Patterns of the Formation of Mobile Localized Magnetic Configurations and Technology for Manufacturing Structures for the Implementation of Magnetic Memory Elements

   • A. V. Prokaznikov
   • V. A. Paporkov
   • N. A. Evseeva

   OriginalPaper 01 November 2023 Pages: 379 - 392

   

7. Neuromorphic Systems: Devices, Architecture, and Algorithms

   • K. A. Fetisenkova
   • A. E. Rogozhin

   OriginalPaper 01 November 2023 Pages: 393 - 410

   

8. Influence of Hot Carrier Degradation on the Characteristics of a High-Voltage SOI Transistor with a Large Drift Region

   • A. S. Novoselov
   • N. V. Masalskii

   OriginalPaper 01 November 2023 Pages: 411 - 418

   

9. Effect of the Material of Electrodes on Electroformation and Properties of Memristors Based on Open Metal–SiO₂–Metal Sandwich Structures

   • V. M. Mordvintsev
   • S. E. Kudryavtsev
   • E. S. Gorlachev

   OriginalPaper 01 November 2023 Pages: 419 - 428

   

10. Study and Analysis of NBTI Effect on pMOSFET Using Fast Measurement Technique

    • Abdelmadjid Benabdelmoumene
    • Boualem Djezzar
    • Boumediene Zatout

    OriginalPaper 01 November 2023 Pages: 429 - 438

    

11. An Overview of the NBTI Phenomenon in MOS Devices

    • DhiaElhak Messaoud
    • Boualem Djezzar
    • Abdelkader Zitouni

    OriginalPaper 01 November 2023 Pages: 439 - 468