Controlling Silicon Etching Parameters in RF CHF3 Plasma by Optical Emission Spectroscopy D. B. MurinI. A. ChesnokovA. M. Efremov OriginalPaper 04 April 2023 Pages: 1 - 8
Calculation of the Electric Field Strength and Current Density Inside a Thin Metal Layer, Taking into Account the Skin Effect E. V. ZavitaevO. V. RusakovE. P. Chukhleb OriginalPaper 04 April 2023 Pages: 9 - 20
Simulation of Supercell Defect Structure and Transfer Phenomena in TlInTe2 M. M. AsadovS. N. MustafaevaV. F. Lukichev OriginalPaper 04 April 2023 Pages: 21 - 31
Study of Photodetectors with Schottky Barriers Based on the IrSiāSi Contact E. A. Kerimov OriginalPaper 04 April 2023 Pages: 32 - 34