Optimization of the properties of diamond structures with nitrogen-vacancy centers A. V. Tsukanov OriginalPaper 02 September 2015 Pages: 283 - 296
Parameters of plasma and mechanisms of etching of metals and semiconductors in HCl + Ar, H2, O2, and Cl2 mixtures A. M. EfremovD. B. Murin OriginalPaper 02 September 2015 Pages: 297 - 303
Installation for etching and deposition of thin-film structures by a fast neutral particle beam Yu. P. MaishevS. L. ShevchukYu. P. Terent’ev OriginalPaper 02 September 2015 Pages: 304 - 311
Deterministic and nondeterministic failure models of LSI circuits exposed to radiation V. M. BarbashovN. S. TrushkinO. A. Kalashnikov OriginalPaper 02 September 2015 Pages: 312 - 315
Error-correction coding in CMOS RAM resistant to the effect of single nuclear particles K. A. PetrovV. Ya. Stenin OriginalPaper 02 September 2015 Pages: 316 - 323
Simulation of the characteristics of the DICE 28-nm CMOS cells in unsteady states caused by the effect of single nuclear particles V. Ya. Stenin OriginalPaper 02 September 2015 Pages: 324 - 334
Modified CMBS circuit technology domino V. A. Lementuev OriginalPaper 02 September 2015 Pages: 335 - 337
Logical optimization efficiency in the synthesis of combinational circuits N. A. AvdeevP. N. Bibilo OriginalPaper 02 September 2015 Pages: 338 - 354