Impurity accumulation in an adsorption layer during MBE doping Yu. Yu. Hervieu OriginalPaper 26 November 2014 Pages: 519 - 525
New hybrid materials for organic light-emitting diode devices R. I. AvetisovO. B. PetrovaI. Kh. Avetisov OriginalPaper 26 November 2014 Pages: 526 - 530
Formation and structure of mesoporous silicon N. I. KarginA. O. SultanovA. S. Ionov OriginalPaper 26 November 2014 Pages: 531 - 535
Formation of bidomain structure in lithium niobate plates by the stationary external heating method A. S. BykovS. G. GrigoryanYu. N. Parkhomenko OriginalPaper 26 November 2014 Pages: 536 - 542
Formation of ferroelectic domain stuctures in LiTaO3 crystals formed by direct electron-beam repolarization D. V. RoschupkinE. V. EmelinO. A. Buzanov OriginalPaper 26 November 2014 Pages: 543 - 545
Statistical analysis of germanium influence on radiation and thermal stability of the n-p-n-p device structures based on CZ-Si〈P,Ge〉 electrophysical properties S. V. BytkinT. V. KritskayaS. P. Kobeleva OriginalPaper 26 November 2014 Pages: 546 - 551
Electrophysical and photoelectrical properties of MIS structures based on MBE grown heteroepitaxial HgCdTe MIS structures with inhomogeneous composition distribution A. V. VoitsekhovskiiS. N. NesmelovS. M. Dzyadookh OriginalPaper 26 November 2014 Pages: 552 - 558
Photoelectric converters in a system with spectral splitting of the solar energy S. Yu. KurinV. D. DoroninK. B. Eidel’man OriginalPaper 26 November 2014 Pages: 559 - 564
Influence of conditions of growth on the structural perfection of AlN layers obtained by the MOS-hydride Epitaxy Method A. V. MazalovD. R. SabitovR. Kh. Akchurin OriginalPaper 26 November 2014 Pages: 565 - 568
Technological features of the formation of transparent conductive contacts of ITO film for LEDs based on gallium nitride K. D. VanyukhinR. V. ZakharchenkoL. A. Seidman OriginalPaper 26 November 2014 Pages: 569 - 574
On the temperature dependence of silicon quantum dot photoluminescence S. N. NagornykhV. I. PavlenkovD. I. Tetelbaum OriginalPaper 26 November 2014 Pages: 575 - 580
Integrated-differential method of thermal spectroscopy of energy levels in semiconductors by their charge trap F. I. Manyakhin OriginalPaper 26 November 2014 Pages: 581 - 586
Applying the in situ X-ray reflectometry method to define the nanodimensional silicon film parameters I. S. SmirnovE. G. NovoselovaI. S. Monakhov OriginalPaper 26 November 2014 Pages: 587 - 589