1. Initial stage of semiinsulating polycrystalline silicon film growth

   • A. S. Turtsevich
   • O. Yu. Nalivaiko
   • G. V. Lepeshkevich

   Thin Films 08 November 2008 Pages: 349 - 355

2. Formation and some properties of chromium oxide nanolayers on semiconductors

   • Yu. K. Ezhovskii
   • V. Yu. Kholkin

   Thin Films 08 November 2008 Pages: 356 - 362

3. Elastic-stress relaxation in heteroepitaxial structures investigated by computer simulation

   • O. S. Trushin

   Micro- and Nanostructure Modeling 08 November 2008 Pages: 363 - 372

4. High-frequency admittance of a thin circular metal wire

   • E. V. Zavitaev
   • A. A. Yushkanov

   Micro- and Nanostructure Modeling 08 November 2008 Pages: 373 - 381

5. Numerical simulation of two-particle resonant scattering with the formation of a molecular ion

   • K. S. Arakelov

   Micro- and Nanostructure Modeling 08 November 2008 Pages: 382 - 389

6. Geometric aspects of AFM imaging

   • Yu. A. Novikov
   • A. V. Rakov
   • P. A. Todua

   Nanostructure Science 08 November 2008 Pages: 390 - 409

7. Fully depleted SOI CMOS logic gates for low-voltage applications

   • N. V. Masal’skii

   Circuit Analysis and Synthesis 08 November 2008 Pages: 410 - 417