In celebration of Alexander A. Orlikovsky’s 70th birthday and 45-year career as a scientist, an administrator, and an educator Personalia 22 July 2008 Pages: 213 - 214
Formation of the TiN/CoSi2 system by rapid thermal annealing of a Co/Ti/Si structure V. I. RudakovV. N. Gusev Materials and Microstructure Characterization 22 July 2008 Pages: 215 - 225
Potential applications of LF-noise spectroscopy to the development of new-generation gas sensors M. I. Makoviychuk Materials and Microstructure Characterization 22 July 2008 Pages: 226 - 237
High-frequency admittance of a thin circular semiconductor wire I. A. KuznetsovaA. A. YushkanovR. R. Khadchukaev Solid-State Devices 22 July 2008 Pages: 238 - 244
Silicon multiplexers for 1 × 576 HgCdTe IR focal-plane arrays A. I. KozlovI. V. MarchishinV. N. Ovsyuk Solid-State Devices 22 July 2008 Pages: 245 - 252
Power-reduction techniques for CMOS pipelined ADCs A. S. GumenyukYu. I. Bocharov Circuits and Systems 22 July 2008 Pages: 253 - 263
Comparative analysis of wideband CMOS low-noise amplifiers for the RF range E. V. BalashovA. S. Korotkov Circuits and Systems 22 July 2008 Pages: 264 - 276
Versatile instrument for MOSFET characterization A. V. KlekachevS. N. KuznetsovV. A. Gurtov Circuits and Systems 22 July 2008 Pages: 277 - 282