Fourth generation information measuring systems: Characteristics and problems of metrological provisions A. D. Pinchevskii OriginalPaper Pages: 741 - 744
Characteristics of metrological provisions for APPCS M. I. KornyukhovN. N. Rogachev OriginalPaper Pages: 744 - 746
Methodology of developing automated systems for scientific research by accounting for accuracy criteria V. M. Vukolikov OriginalPaper Pages: 747 - 749
State and prospects of development of the standardization and technical base of metrological provisions for IMS Yu. R. KalitsinskiiB. D. KolpakA. L. Semenyuk OriginalPaper Pages: 749 - 752
Regulation of requirements for metrological provisions for IMS and APPCS in the technical documents S. A. AndrusyakM. F. NatalyukB. D. Kolpak OriginalPaper Pages: 753 - 756
Methodical principles of organizing and conducting metrological certification of IMS B. D. Kolpak OriginalPaper Pages: 757 - 758
Metrologic support to navigational gyroscopic instruments I. V. PavlovV. I. ZaitsevN. N. Litvinova OriginalPaper Pages: 759 - 762
A capacitance measurer of the diameter of a fast-moving glass fiber E. V. AleksenkoL. E. KaletaN. K. Sharuev OriginalPaper Pages: 762 - 764
Evaluating the error of converters of rotation angle to code B. N. Ivanov OriginalPaper Pages: 769 - 772
A computerized system for measuring engineering-laser parameters V. I. AndreevL. V. BerdnikovV. A. Yakovlev OriginalPaper Pages: 773 - 774
Diffraction-diagram effects from the cross section shape in an insulating cylinder A. A. VorontsovS. D. Mirovitskaya OriginalPaper Pages: 774 - 777
Checking geometrical distortion and data loss in optoelectronic conversion in an image input dissector V. P. IvannikovS. P. Perepelov OriginalPaper Pages: 777 - 780
AN autocollimation system for measuring angular displacements of remote objects by means of birefringence Yu. M. KlimkovM. I. Shribak OriginalPaper Pages: 781 - 785
Metrological characteristics of quantum frequency-standards in the time domain N. V. GoldovskayaE. K. BibikovV. V. Onopko OriginalPaper Pages: 786 - 790
A discrete integrator for differential pressure gauge/flow meters V. I. Chegodaev OriginalPaper Pages: 800 - 802
A multichannel laser system for automatic vibration control Yu. F. Zastrogin OriginalPaper Pages: 802 - 807
Methods of determination of the input parameters of secondary devices for vibrometers A. E. ManokhinG. V. ZusmanO. V. Ichalova OriginalPaper Pages: 807 - 810
Method of complex series resistance for determination of the input parameters of secondary devices of vibrometers A. E. ManokhinO. V. Ichalova OriginalPaper Pages: 811 - 813
Experimental determination of the magnetoelastic sensitivity of ferromagnetic materials A. M. BorisovS. D. LevintovM. F. Belyaev OriginalPaper Pages: 814 - 816
Automatic measurement of galvanomagnetic parameters of narrow-gap semiconductor devices V. V. Bespal'koA. R. Shelyag OriginalPaper Pages: 817 - 819
Measuring the carrier frequency of radio-frequency signals by the comparison method L. G. TsypkunA. A. Shupta OriginalPaper Pages: 820 - 821
Standardization of varicap loss tangent measurements M. D. KlionskiiS. V. Verbitskii OriginalPaper Pages: 822 - 824
Application of an auxiliary waveguide line for the certification of thermal noise generators O. G. PetrosyanM. V. Sargsyan OriginalPaper Pages: 826 - 829
Primary-standard equipment for reproducing and transmitting the energy unit for alpha particles from radionuclide sources E. A. Frolov OriginalPaper Pages: 830 - 835
A method of determining the direction to a high-energy charged-particle source N. N. RadaevE. V. LotyshevV. M. Kirillov OriginalPaper Pages: 835 - 838
Metrological support to fluorine neutron-activation logging V. B. Chermeninov OriginalPaper Pages: 838 - 841
Some testing-program optimization problems for complex systems V. I. Miroshnichenko OriginalPaper Pages: 845 - 849
