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Translated from Izmeritel'naya Tekhnika, No. 8, pp. 42–43, August, 1991.
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Bespal'ko, V.V., Shelyag, A.R. Automatic measurement of galvanomagnetic parameters of narrow-gap semiconductor devices. Meas Tech 34, 817–819 (1991). https://doi.org/10.1007/BF00981797
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DOI: https://doi.org/10.1007/BF00981797