1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes Pages: 317 - 317

2. Guest editor's introduction

   • Pinaki Mazumder

   EditorialNotes Pages: 319 - 320

3. Tutorial on semiconductor memory testing

   • B. F. Cockburn

   OriginalPaper Pages: 321 - 336

4. Effective march algorithms for testing single-order addressed memories

   • AD J. Van De Goor
   • Yervant Zorian

   OriginalPaper Pages: 337 - 345

5. Technology and layout-related testing of static random-access memories

   • Kanad Chakraborty
   • Pinaki Mazumder

   OriginalPaper Pages: 347 - 365

6. On-chip testing of random access memories

   • Kewal K. Saluja

   OriginalPaper Pages: 367 - 376

7. Zero aliasing ROM BIST

   • O. Kebichi
   • V. N. Yarmolik
   • M. Nicolaidis

   OriginalPaper Pages: 377 - 388