1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes Pages: 295 - 295

2. Guest editor's introduction

   • Mani Soma

   EditorialNotes Pages: 297 - 298

3. Improving the testability of switched-capacitor filters

   • J. L. Huertas
   • A. Rueda
   • D. Vázquez

   OriginalPaper Pages: 299 - 313

4. Enhancing design-for-test for active analog filters by using CLP

   • Franc Novak
   • Igor Mozetič
   • Anton Biasizzo

   OriginalPaper Pages: 315 - 329

5. Multiple fault analog circuit testing by sensitivity analysis

   • Naim Ben Hamida
   • Bozena Kaminska

   OriginalPaper Pages: 331 - 343

6. Fault simulation of linear analog circuits

   • Naveena Nagi
   • Abhijit Chatterjee
   • Jacob A. Abraham

   OriginalPaper Pages: 345 - 360

7. A hierarchical analog test bus framework for testing mixed-signal integrated circuits and printed circuit boards

   • Nai-Chi Lee

   OriginalPaper Pages: 361 - 368

8. A structure for interconnect testing on mixed-signal boards

   • B. R. Wilkins
   • B. S. Suparjo

   OriginalPaper Pages: 369 - 374