On Reducing Test Data Volume for Circular Scan Architecture Using Modified Shuffled Shepherd Optimization Muralidharan JayabalanE. SrinivasP. Rajesh OriginalPaper 19 November 2021 Pages: 577 - 592
A Framework for Configurable Joint-Scan Design-for-Test Architecture Jaynarayan T. TuduSatyadev AhlawatVirendra Singh OriginalPaper 10 December 2021 Pages: 593 - 611
Analysis of Security Vulnerability Levels of In-Vehicle Network Topologies Applying Graph Representations Zsombor PethoIntiyaz KhanÁrpád Torok OriginalPaper Open access 10 January 2022 Pages: 613 - 621
Error-Efficient Approximate Multiplier Design using Rounding Based Approach for Image Smoothing Application E. Jagadeeswara RaoP. Samundiswary OriginalPaper 10 November 2021 Pages: 623 - 631
Retesting Defective Circuits to Allow Acceptable Faults for Yield Enhancement Sisir Kumar JenaSantosh BiswasJatindra Kumar Deka OriginalPaper 11 December 2021 Pages: 633 - 652
Reducing Aging Impacts in Digital Sensors via Run-Time Calibration Md Toufiq Hasan AnikMohammad EbrahimabadiNaghmeh Karimi OriginalPaper 01 February 2022 Pages: 653 - 673
A Bit-Error Rate Measurement and Error Analysis of Wireline Data Transmission using Current Source Model for Single Event Effect under Irradiation Environment Takefumi YoshikawaMasahiro IshimaruKazutoshi Kobayashi OriginalPaper 04 January 2022 Pages: 675 - 684
Parameterizable Real Number Models for Mixed-Signal Designs Using SystemVerilog Nikolaos GeorgoulopoulosAlkiviadis Hatzopoulos OriginalPaper 08 December 2021 Pages: 685 - 700
A Test Generation Method of R-2R Digital-to-Analog Converters Based on Genetic Algorithm Xiaoyan YangChenglin YangHoujun Wang OriginalPaper 19 November 2021 Pages: 701 - 713
Stress-Aware Periodic Test of Interconnects Somayeh Sadeghi-KohanSybille HellebrandHans-Joachim Wunderlich OriginalPaper Open access 04 January 2022 Pages: 715 - 728
