New Method for Determining and Predicting Test Interconnect Pin Current Carrying Capacity Eli GurevichPranit Deshmukh OriginalPaper 19 August 2020 Pages: 445 - 460
An Analytic Model for Predicting Single Event (SE) Crosstalk of Nanometer CMOS Circuits Baojun LiuLi CaiXiaoqiang Liu OriginalPaper 09 July 2020 Pages: 461 - 467
Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults Shuo CaiBinyong HeMember, IEEE OriginalPaper 01 August 2020 Pages: 469 - 483
Diagnosis of Incipient Faults in Nonlinear Analog Circuits Based on High Order Moment Fractional Transform Yong DengTing ChenDi Zhang OriginalPaper 12 June 2020 Pages: 485 - 498
Evaluation of Ionizing Radiation Effects on Device Modules Used in Wireless-Based Monitoring Systems Q. HuangJ. JiangY. Q. Deng OriginalPaper 02 July 2020 Pages: 499 - 508
Novel MEMS Piezoresistive Sensor with Hair-Pin Structure to Enhance Tensile and Compressive Sensitivity and Correct Non-Linearity Sumit Kumar JindalRitobrita DeSanjeev Kumar Raghuwanshi OriginalPaper 16 July 2020 Pages: 509 - 517
Testable Architecture Design for Programmable Cellular Automata on FPGA Using Run-Time Dynamically Reconfigurable Look-Up Tables Ayan PalchaudhuriAnindya Sundar Dhar OriginalPaper 24 July 2020 Pages: 519 - 536
Area-Efficient and Reliable Error Correcting Code Circuit Based on Hybrid CMOS/Memristor Circuit Mamoru IshizakaMichihiro ShintaniMichiko Inoue OriginalPaper 19 July 2020 Pages: 537 - 546
Design of an Integrated System for On-line Test and Diagnosis of Rotary Actuators Leonardo B. PiccoliRenato V. B. HenriquesTiago R. Balen OriginalPaper 13 July 2020 Pages: 547 - 553
Low-Power Area-Efficient Fault Tolerant Adder in Current Mode Multi Valued Logic Using Berger Codes Shahram MohammadiReza OmidiMohammad Lotfinejad OriginalPaper 03 June 2020 Pages: 555 - 563
