1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 02 December 2017 Pages: 689 - 690

   

2. 2016 JETTA-TTTC Best Paper Award

   Announcement 03 November 2017 Pages: 691 - 692

   

3. 2016–2017 JETTA Reviewers

   Announcement 22 November 2017 Pages: 693 - 694

4. Test Technology Newsletter

   News 18 November 2017 Pages: 695 - 696

5. A Diagnostics Method for Analog Circuits Based on Improved Kernel Entropy Component Analysis

   • Zhijie Yuan
   • Yigang He
   • Zhen Cheng

   OriginalPaper 21 December 2017 Pages: 697 - 707

   

6. A Low-cost Dithering Method for Improving ADC Linearity Test Applied in uSMILE Algorithm

   • Yan Duan
   • Tao Chen
   • Degang Chen

   OriginalPaper 20 December 2017 Pages: 709 - 720

   

7. A Reliability-Aware Methodology to Isolate Timing-Critical Paths under Aging

   • Ankush Srivastava
   • Virendra Singh
   • Kewal K. Saluja

   OriginalPaper 28 November 2017 Pages: 721 - 739

   

8. Study on Magnetic Probe Calibration in Near-field Measurement System for EMI Application

   • Gengxin Tian
   • Jun Li
   • Liqiang Cao

   OriginalPaper 13 December 2017 Pages: 741 - 750

   

9. Evaluating the Effectiveness of D-chains in SAT-based ATPG and Diagnostic TPG

   • Pascal Raiola
   • Jan Burchard
   • Bernd Becker

   OriginalPaper 08 December 2017 Pages: 751 - 767

   

10. A Study of PN Junction Diffusion Capacitance of MOSFET in Presence of Single Event Transient

    • Tengyue Yi
    • Yi Liu
    • Yintang Yang

    OriginalPaper 01 December 2017 Pages: 769 - 773

    

11. A Low Power Online Test Method for FPGA Single Solder Joint Resistance

    • Nantian Wang
    • Xiaoyu Ma
    • Ziqiao Rui

    OriginalPaper 11 December 2017 Pages: 775 - 780