Journal of Electronic Testing

, Volume 33, Issue 6, pp 691–692 | Cite as

2016 JETTA-TTTC Best Paper Award

Masahiro Ishida, Toru Nakura, Takashi Kusaka, Satoshi Komatsu and Kunihiro Asada, “Dynamic Power Integrity Control of ATE for Eliminating Overkills and Underkills in Device Testing,” Journal of Electronic Testing: Theory and Applications, Volume 32, Number 3, pp. 257–271, June 2016

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© Springer Science+Business Media, LLC 2017

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