1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 05 September 2015 Pages: 335 - 335

2. Test Technology Newsletter

   News 01 September 2015 Pages: 337 - 338

   

3. Application of Contactless Testing to PCBs with BGAs and Open Sockets

   • Abdelghani Renbi
   • Jerker Delsing

   OriginalPaper 19 August 2015 Pages: 339 - 347

   

4. A High Performance SEU Tolerant Latch

   • Zhengfeng Huang
   • Huaguo Liang
   • Sybille Hellebrand

   OriginalPaper 23 July 2015 Pages: 349 - 359

   

5. Automated Functional Test Generation for Digital Systems Through a Compact Binary Differential Evolution Algorithm

   • Alfonso Martinez Cruz
   • Ricardo Barrón Fernández
   • Luis Alfonso Villa Vargas

   OriginalPaper 24 September 2015 Pages: 361 - 380

   

6. Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors

   • Athanasios Dimakos
   • Haralampos-G. Stratigopoulos
   • Emeric De Foucauld

   OriginalPaper 25 August 2015 Pages: 381 - 394

   

7. A Novel Built-in Current Sensor for N-WELL SET Detection

   • H.-B. Wang
   • R. Liu
   • Y.-Q. Li

   OriginalPaper 05 September 2015 Pages: 395 - 401

   

8. A Maximum Power Algorithm to Find Frequencies for Aperiodic Clock Testing

   • Sindhu Gunasekar
   • Vishwani D. Agrawal

   OriginalPaper 07 August 2015 Pages: 403 - 410

   

9. Impact of Total Ionizing Dose on Bulk Built-In Current Sensors with Dynamic Storage Cell

   • Alexandre Simionovski
   • Rafael G. Vaz
   • Gilson Wirth

   OriginalPaper 26 August 2015 Pages: 411 - 417

   

10. Erratum to: A Small Chip Area Stochastic Calibration for TDC Using Ring Oscillator

    • Kentaroh Katoh
    • Yutaro Kobayashi
    • Haruo Kobayashi

    Erratum 23 December 2014 Pages: 419 - 419