Digital Calibration for 8-bit Delay Line ADC Using Harmonic Distortion Correction Hsun-Cheng LeeJacob A. Abraham OriginalPaper 19 April 2015 Pages: 127 - 138
Application-Based Analysis of Register File Criticality for Reliability Assessment in Embedded Microprocessors Felipe Restrepo-CalleSergio Cuenca-AsensiFernanda Lima Kastensmidt OriginalPaper 20 February 2015 Pages: 139 - 150
Scalable and Optimized Hybrid Verification of Embedded Software Jörg BehrendDjones LettninWolfgang Rosenstiel OriginalPaper 27 March 2015 Pages: 151 - 166
Reusing RTL Assertion Checkers for Verification of SystemC TLM Models Nicola BombieriFranco FummiMirella Negro Marcigaglia OriginalPaper 20 March 2015 Pages: 167 - 180
A Determinate Radiation Hardened Technique for Safety-Critical CMOS Designs Ryan H.-M. HuangDennis K.-H. HsuCharles H.-P. Wen OriginalPaper 27 March 2015 Pages: 181 - 192
Formal Quantification of the Register Vulnerabilities to Soft Error in RTL Control Paths Liang ChenMojtaba EbrahimiMehdi B. Tahoori OriginalPaper 11 April 2015 Pages: 193 - 206
A Shift-Register Based BIST Architecture for FPGA Global Interconnect Testing and Diagnosis Igor Gadelha PereiraLeonardo Alves DiasCleonilson Protásio de Souza OriginalPaper 13 March 2015 Pages: 207 - 215
Analog Circuits Soft Fault Diagnosis Using Rényi’s Entropy Xuan XieXifeng LiYongle Xie OriginalPaper 29 March 2015 Pages: 217 - 224