1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 28 November 2014 Pages: 637 - 638

   

2. 2013 JETTA-TTTC Best Paper Award

   Announcement 29 November 2014 Pages: 639 - 640

3. Test Technology Newsletter

   News 14 November 2014 Pages: 641 - 642

   

4. Testing Disturbance Faults in Various NAND Flash Memories

   • Chih-Sheng Hou
   • Jin-Fu Li

   OriginalPaper 01 November 2014 Pages: 643 - 652

   

5. A Small Chip Area Stochastic Calibration for TDC Using Ring Oscillator

   • Kentaroh Katoh
   • Yutaro Kobayashi
   • Haruo Kobayashi

   OriginalPaper 05 November 2014 Pages: 653 - 663

   

6. Characterization of a Passive Telemetric System for ISM Band Pressure Sensors

   • Yujia Peng
   • B. M. Farid Rahman
   • Xuejun Wen

   OriginalPaper 25 October 2014 Pages: 665 - 671

   

7. Efficient LFSR Reseeding Based on Internal-Response Feedback

   • Wei-Cheng Lien
   • Kuen-Jong Lee
   • Krishnendu Chakrabarty

   OriginalPaper 30 September 2014 Pages: 673 - 685

   

8. Efficient Error-Tolerability Testing on Image Processing Circuits Based on Equivalent Error Rate Transformation

   • Tong-Yu Hsieh
   • Yi-Han Peng
   • Kuan-Hsien Li

   OriginalPaper 05 November 2014 Pages: 687 - 699

   

9. On-line Condition Monitoring and Maintenance of Power Electronic Converters

   • Shakeb A. Khan
   • Tariqul Islam
   • A. K. Agarwala

   OriginalPaper 09 November 2014 Pages: 701 - 709

   

10. Access Port Protection for Reconfigurable Scan Networks

    • Rafal Baranowski
    • Michael A. Kochte
    • Hans-Joachim Wunderlich

    OriginalPaper 18 October 2014 Pages: 711 - 723

    

11. Low-Cost Concurrent Error Detection for GCM and CCM

    • Xiaofei Guo
    • Ramesh Karri

    OriginalPaper 29 November 2014 Pages: 725 - 737

    

12. Three-Level Management Algorithm to Increase the SEU Emulation Rate in DPR Based Emulators

    • Reza Omidi Gosheblagh
    • Karim Mohammadi

    OriginalPaper 28 October 2014 Pages: 739 - 749

    

13. Single Event Resilient Dynamic Logic Designs

    • H.-B. Wang
    • M.-L. Li
    • J.-S. Bi

    OriginalPaper 27 November 2014 Pages: 751 - 761

    

14. Diagnostic Test Generation for Transition Delay Faults Using Stuck-At Fault Detection Tools

    • Yu Zhang
    • Bei Zhang
    • Vishwani D. Agrawal

    OriginalPaper 31 October 2014 Pages: 763 - 780