1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 08 April 2014 Pages: 155 - 156

2. Test Technology Newsletter

   News 28 March 2014 Pages: 157 - 158

   

3. An On-Chip Sensor to Monitor NBTI Effects in SRAMs

   • A. Ceratti
   • T. Copetti
   • R. Fagundes

   OriginalPaper 15 April 2014 Pages: 159 - 169

   

4. An RTN Variation Tolerant SRAM Screening Test Design with Gaussian Mixtures Approximations of Long-Tail Distributions

   • Worawit Somha
   • Hiroyuki Yamauchi

   OriginalPaper 11 March 2014 Pages: 171 - 181

   

5. Error Correction Schemes with Erasure Information for Fast Memories

   • Samuel Evain
   • Valentin Savin
   • Valentin Gherman

   OriginalPaper 21 March 2014 Pages: 183 - 192

   

6. Developing Inherently Resilient Software Against Soft-Errors Based on Algorithm Level Inherent Features

   • Bahman Arasteh
   • Seyed Ghassem Miremadi
   • Amir Masoud Rahmani

   OriginalPaper 25 February 2014 Pages: 193 - 212

   

7. Low Cost Signal Reconstruction Based Testing of RF Components using Incoherent Undersampling

   • Debesh Bhatta
   • Aritra Banerjee
   • Abhijit Chatterjee

   OriginalPaper 26 April 2014 Pages: 213 - 228

   

8. A Test Time Theorem and its Applications

   • Praveen Venkataramani
   • Suraj Sindia
   • Vishwani D. Agrawal

   OriginalPaper 27 April 2014 Pages: 229 - 236

   

9. Test Data Compression for System-on-a-Chip using Count Compatible Pattern Run-Length Coding

   • Haiying Yuan
   • Jiaping Mei
   • Kun Guo

   OriginalPaper 23 April 2014 Pages: 237 - 242

   

10. Soft Fault Diagnosis of Analog Circuits via Frequency Response Function Measurements

    • Yongle Xie
    • Xifeng Li
    • Qizhong Zhou

    OriginalPaper 26 April 2014 Pages: 243 - 249