1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 19 November 2013 Pages: 741 - 742

   

2. Test Technology Newsletter

   News 06 November 2013 Pages: 743 - 744

   

3. Physics-Based Low-Cost Test Technique for High Voltage LDMOS

   • Sukeshwar Kannan
   • Kaushal Kannan
   • Doug Mirizzi

   OriginalPaper 15 November 2013 Pages: 745 - 762

   

4. Online Testable Approaches in Reversible Logic

   • N. M. Nayeem
   • J. E. Rice

   OriginalPaper 14 August 2013 Pages: 763 - 778

   

5. Autonomous Fault-Tolerant Systems onto SRAM-based FPGA Platforms

   • Cristiana Bolchini
   • Antonio Miele
   • Chiara Sandionigi

   OriginalPaper 13 November 2013 Pages: 779 - 793

   

6. Effective Timing Error Tolerance in Flip-Flop Based Core Designs

   • Stefanos Valadimas
   • Yiorgos Tsiatouhas
   • Petros Xarchakos

   OriginalPaper 07 November 2013 Pages: 795 - 804

   

7. A Fault Tolerant Approach for FPGA Embedded Processors Based on Runtime Partial Reconfiguration

   • Alexandros Vavousis
   • Andreas Apostolakis
   • Mihalis Psarakis

   OriginalPaper 03 December 2013 Pages: 805 - 823

   

8. Selective SWIFT-R

   • Felipe Restrepo-Calle
   • Antonio Martínez-Álvarez
   • Antonio Jimeno-Morenilla

   OriginalPaper 07 November 2013 Pages: 825 - 838

   

9. MoDiVHA: A Hierarchical Strategy for Distributed Test Assignment

   • Jefferson P. Koppe
   • Elias P. Duarte Jr.
   • Luis C. E. Bona

   OriginalPaper 09 August 2013 Pages: 839 - 847

   

10. Efficient Test Compression Technique for SoC Based on Block Merging and Eight Coding

    • Tie-Bin Wu
    • Heng-Zhu Liu
    • Peng-Xia Liu

    OriginalPaper 07 November 2013 Pages: 849 - 859

    

11. Survey and Evaluation of Automated Model Generation Techniques for High Level Modeling and High Level Fault Modeling

    • Likun Xia
    • Muhammad Umer Farooq
    • Aamir Saeed Malik

    OriginalPaper 24 August 2013 Pages: 861 - 877

    

12. Multi-bit Sigma-Delta TDC Architecture with Improved Linearity

    • Satoshi Uemori
    • Masamichi Ishii
    • Nobukazu Takai

    OriginalPaper 04 October 2013 Pages: 879 - 892

    

13. Low Cost Time Efficient Multi-tone Test Signal Generation Using OFDM Technique

    • Tian Xia
    • Rohit Shetty
    • Mustapha Slamani

    OriginalPaper 26 October 2013 Pages: 893 - 901

    

14. Preserving Hamming Distance in Arithmetic and Logical Operations

    • Shlomi Dolev
    • Sergey Frenkel
    • Vladimir Sinelnikov

    OriginalPaper 15 November 2013 Pages: 903 - 907