Physics-Based Low-Cost Test Technique for High Voltage LDMOS Sukeshwar KannanKaushal KannanDoug Mirizzi OriginalPaper 15 November 2013 Pages: 745 - 762
Online Testable Approaches in Reversible Logic N. M. NayeemJ. E. Rice OriginalPaper 14 August 2013 Pages: 763 - 778
Autonomous Fault-Tolerant Systems onto SRAM-based FPGA Platforms Cristiana BolchiniAntonio MieleChiara Sandionigi OriginalPaper 13 November 2013 Pages: 779 - 793
Effective Timing Error Tolerance in Flip-Flop Based Core Designs Stefanos ValadimasYiorgos TsiatouhasPetros Xarchakos OriginalPaper 07 November 2013 Pages: 795 - 804
A Fault Tolerant Approach for FPGA Embedded Processors Based on Runtime Partial Reconfiguration Alexandros VavousisAndreas ApostolakisMihalis Psarakis OriginalPaper 03 December 2013 Pages: 805 - 823
Selective SWIFT-R Felipe Restrepo-CalleAntonio Martínez-ÁlvarezAntonio Jimeno-Morenilla OriginalPaper 07 November 2013 Pages: 825 - 838
MoDiVHA: A Hierarchical Strategy for Distributed Test Assignment Jefferson P. KoppeElias P. Duarte Jr.Luis C. E. Bona OriginalPaper 09 August 2013 Pages: 839 - 847
Efficient Test Compression Technique for SoC Based on Block Merging and Eight Coding Tie-Bin WuHeng-Zhu LiuPeng-Xia Liu OriginalPaper 07 November 2013 Pages: 849 - 859
Survey and Evaluation of Automated Model Generation Techniques for High Level Modeling and High Level Fault Modeling Likun XiaMuhammad Umer FarooqAamir Saeed Malik OriginalPaper 24 August 2013 Pages: 861 - 877
Multi-bit Sigma-Delta TDC Architecture with Improved Linearity Satoshi UemoriMasamichi IshiiNobukazu Takai OriginalPaper 04 October 2013 Pages: 879 - 892
Low Cost Time Efficient Multi-tone Test Signal Generation Using OFDM Technique Tian XiaRohit ShettyMustapha Slamani OriginalPaper 26 October 2013 Pages: 893 - 901
Preserving Hamming Distance in Arithmetic and Logical Operations Shlomi DolevSergey FrenkelVladimir Sinelnikov OriginalPaper 15 November 2013 Pages: 903 - 907