ADC Multi-Site Test Based on a Pre-test with Digital Input Stimulus Xiaoqin ShengHans KerkhoffGuido Gronthoud OriginalPaper 31 August 2012 Pages: 393 - 404
BIST/Digital-Compatible Testing of RF Devices Using Distortion Model Fitting Shreyas SenAritra BanerjeeAbhijit Chatterjee OriginalPaper 06 July 2012 Pages: 405 - 419
Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits Judit F. FreijedoJorge SemiãoJ. Paulo Teixeira OriginalPaper 01 May 2012 Pages: 421 - 434
On the Reuse of TLM Mutation Analysis at RTL Valerio GuarnieriGiuseppe Di GuglielmoRaimund Ubar OriginalPaper 25 May 2012 Pages: 435 - 448
Cohesive Coverage Management: Simulation Meets Formal Methods Aritra HazraPriyankar GhoshPartha Pratim Chakrabarti OriginalPaper 02 June 2012 Pages: 449 - 468
Time-Constraint-Aware Optimization of Assertions in Embedded Software Viacheslav IzosimovGiuseppe Di GuglielmoMasahiro Fujita OriginalPaper 18 July 2012 Pages: 469 - 486
Multiple Soft Fault Diagnosis of Nonlinear Circuits Using the Continuation Method Michał TadeusiewiczStanisław Hałgas OriginalPaper Open access 01 June 2012 Pages: 487 - 493
FAST: An RTL Fault Simulation Framework based on RTL-to-TLM Abstraction Nicola BombieriFranco FummiValerio Guarnieri OriginalPaper 22 July 2012 Pages: 495 - 510
Identifying Untestable Faults in Sequential Circuits Using Test Path Constraints Taavi ViilukasAnton KarputkinHideo Fujiwara OriginalPaper 13 July 2012 Pages: 511 - 521
Yield Improvement for 3D Wafer-to-Wafer Stacked Memories Mottaqiallah TaouilSaid Hamdioui OriginalPaper Open access 21 July 2012 Pages: 523 - 534
A Novel TOPSIS-Based Test Vector Compaction Technique for Analog Fault Detection Badar-ud-din AhmedWang YourenNajam-ud-din Ahmed OriginalPaper 30 August 2012 Pages: 535 - 540
Defect Level and Fault Coverage in Coefficient Based Analog Circuit Testing Suraj SindiaVishwani D. AgrawalVirendra Singh Letter 19 June 2012 Pages: 541 - 549