1. A SPICE-Like 2T-FLOTOX Core-Cell Model for Defect Injection and Faulty Behavior Prediction in eFlash

   • O. Ginez
   • J.-M. Daga
   • A. Virazel

   OriginalPaper 31 January 2009 Pages: 127 - 144

   

2. A Built-in-Self-Test Σ-Δ ADC Prototype

   • Hao-Chiao Hong
   • Sheng-Chuan Liang
   • Hong-Chin Song

   OriginalPaper 31 January 2009 Pages: 145 - 156

   

3. Test Points Selection for Analog Fault Dictionary Techniques

   • Chenglin Yang
   • Shulin Tian
   • Bing Long

   OriginalPaper 30 January 2009 Pages: 157 - 168

   

4. A Novel Fault Localization Technique Based on Deconvolution and Calibration of Power Pad Transients Signals

   • Reza M. Rad
   • Jim Plusquellic

   OriginalPaper 30 January 2009 Pages: 169 - 185

   

5. A New Algorithm for the Selection of Control Cells in Boundary-Scan Interconnect Test

   • A. Quiros-Olozabal
   • M. A. Cifredo-Chacon

   OriginalPaper 30 January 2009 Pages: 187 - 195

   

6. Soft Error Rate Reduction Using Circuit Optimization and Transient Filter Insertion

   • Mihir R. Choudhury
   • Quming Zhou
   • Kartik Mohanram

   OriginalPaper 16 April 2009 Pages: 197 - 207