A SPICE-Like 2T-FLOTOX Core-Cell Model for Defect Injection and Faulty Behavior Prediction in eFlash O. GinezJ.-M. DagaA. Virazel OriginalPaper 31 January 2009 Pages: 127 - 144
A Built-in-Self-Test Σ-Δ ADC Prototype Hao-Chiao HongSheng-Chuan LiangHong-Chin Song OriginalPaper 31 January 2009 Pages: 145 - 156
Test Points Selection for Analog Fault Dictionary Techniques Chenglin YangShulin TianBing Long OriginalPaper 30 January 2009 Pages: 157 - 168
A Novel Fault Localization Technique Based on Deconvolution and Calibration of Power Pad Transients Signals Reza M. RadJim Plusquellic OriginalPaper 30 January 2009 Pages: 169 - 185
A New Algorithm for the Selection of Control Cells in Boundary-Scan Interconnect Test A. Quiros-OlozabalM. A. Cifredo-Chacon OriginalPaper 30 January 2009 Pages: 187 - 195
Soft Error Rate Reduction Using Circuit Optimization and Transient Filter Insertion Mihir R. ChoudhuryQuming ZhouKartik Mohanram OriginalPaper 16 April 2009 Pages: 197 - 207