Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach M. Portela-GarciaA. LindosoF. Vargas OriginalPaper 24 August 2012 Pages: 777 - 789
Prediction of Long-term Immunity of a Phase-Locked Loop A. BoyerS. Ben DhiaB. Vrignon OriginalPaper 30 November 2012 Pages: 791 - 802
A Test Platform for Dependability Analysis of SoCs Exposed to EMI and Radiation Juliano BenficaLetícia Maria Bolzani PoehlsFernando Hernandez OriginalPaper 14 November 2012 Pages: 803 - 816
Kth-Aggressor Fault (KAF)-based Thru-Silicon-Via Interconnect Built-In Self-Test and Diagnosis Vladimir PascaLorena AnghelMounir Benabdenbi OriginalPaper 04 August 2012 Pages: 817 - 829
Structural Test and Diagnosis for Graceful Degradation of NoC Switches Atefe DalirsaniStefan HolstHans-Joachim Wunderlich OriginalPaper 05 October 2012 Pages: 831 - 841
A Non-Enumerative Technique for Measuring Path Correlation in Digital Circuits Stelios N. NeophytouKyriakos ChristouMaria K. Michael OriginalPaper 19 October 2012 Pages: 843 - 856
Current State of the Mixed-Signal Test Bus 1149.4 Jari HannuJuha HäkkinenMarkku Moilanen OriginalPaper 17 November 2012 Pages: 857 - 863
Current Consumption and Power Integrity of CMOS Digital Circuits Under NBTI Wearout J. M. RuizR. Fernández-GarciaM. Morata OriginalPaper 14 November 2012 Pages: 865 - 868
Data-Driven DPPM Estimation and Adaptive Fault Coverage Calibration Using MATLAB® Kanad ChakrabortyVishwani D. Agrawal Letter 09 October 2012 Pages: 869 - 875
Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter Y. RenL. FanB. L. Bhuva OriginalPaper 16 November 2012 Pages: 877 - 883