State of the art and problems of determining high contents of platinum metals in alloys and products (Review) L. P. ZhitenkoV. P. ObrezumovI. A. Khabeev ReviewPaper 09 December 2009 Pages: 1511 - 1522
Development of the constraint equation method with theoretical coefficients in X-ray fluorescent analysis B. D. KalininR. I. Plotnikov OriginalPaper 09 December 2009 Pages: 1523 - 1528
Setup complexes for atomic-emission spectral analysis based on grand spectrometer V. A. Labusov OriginalPaper 09 December 2009 Pages: 1529 - 1536
Integral scintillation spectral element-phase method for substance research V. N. Apolitskii OriginalPaper 09 December 2009 Pages: 1537 - 1542
Extraction of iridium(III) and iridium(IV) chloride complexes by a new sorbent containing sulfur and nitrogen M. V. AfoninS. A. SimanovaN. S. Panina OriginalPaper 09 December 2009 Pages: 1543 - 1547
Use of Purbe diagrams in prediction of optimum conditions of separation and determination of halogens in natural objects using ionometry G. I. Bebeshko OriginalPaper 09 December 2009 Pages: 1548 - 1554
New dynamic approach to preparation of vapor and gas mixtures V. L. BudovichE. B. Polotnyuk OriginalPaper 09 December 2009 Pages: 1555 - 1558
Study of carbon nanomaterials as potential sorbents to concentrate admixtures in the atomic spectroscopy analysis methods S. S. GrazhuleneA. N. Red’kinN. I. Zolotareva OriginalPaper 09 December 2009 Pages: 1559 - 1563
The methods of complete purification of diamonds O. A. Koz’menkoV. G. Vins OriginalPaper 09 December 2009 Pages: 1564 - 1565
Determination of C1–C4 hydrocarbons and sulfur hexafluoride in high-purity germanium tetrafluoride of natural and isotopically enriched composition using gas chromatography V. A. KrylovT. G. Sorochkina OriginalPaper 09 December 2009 Pages: 1566 - 1570
Detection, identification, and quantitative determination of minor phases in solid multielement multiphase compounds and materials V. V. MalakhovL. S. Dovlitova OriginalPaper 09 December 2009 Pages: 1571 - 1579
Determination of boron in high-aluminum semiproduct by inductively coupled plasma atomic emission spectroscopy I. V. NerobeevaT. N. Ermolaeva OriginalPaper 09 December 2009 Pages: 1580 - 1583
Structural methodological scheme to develop analysis procedures for oxide materials using atomic emission spectroscopy V. I. OtmakhovN. V. VarlamovaE. V. Petrova OriginalPaper 09 December 2009 Pages: 1584 - 1587
Atomic-emission spectroscopy data smoothening G. S. SpryginK. V. GrigorovichA. S. Krylov OriginalPaper 09 December 2009 Pages: 1588 - 1592
Study and analysis of gasolines modified during evaporation and burning Z. A. TemerdashevI. A. Kolychev OriginalPaper 09 December 2009 Pages: 1593 - 1597
An integral method to study textures of nanosized crystallites in an electron microscope column (Review) S. K. Maksimov ReviewPaper 09 December 2009 Pages: 1598 - 1609
Single-crystal X-ray diffraction analysis of nonplanar autoepitaxial silicon layers V. T. BublikL. V. KozhitovT. T. Kondratenko OriginalPaper 09 December 2009 Pages: 1610 - 1613
Radioisotope express analysis of tungsten carbide in the manufacture of high-strength cemented carbides V. I. Bochenin OriginalPaper 09 December 2009 Pages: 1614 - 1616
Variation of the X-ray quantitative phase analysis method B. G. Golovkin OriginalPaper 09 December 2009 Pages: 1617 - 1618
Identification of nanoparticles of niobium carbide in steel 10Cr13Mn12Si2Ni2Cu2Nb D. S. ZmienkoI. A. StepanovaA. E. Korneev OriginalPaper 09 December 2009 Pages: 1619 - 1621
Scanning spectrotomography of inhomogeneous surface layers V. A. KotenevD. N. TyurinA. Yu. Tsivadze OriginalPaper 09 December 2009 Pages: 1622 - 1625
Roentgen-phase investigation of monolithic titanium nitride K. B. KuznetsovL. I. ShvornevaK. A. Solntsev OriginalPaper 09 December 2009 Pages: 1626 - 1630
A procedure to study thermo- and electrophysical properties of materials Yu. I. Shtern OriginalPaper 09 December 2009 Pages: 1631 - 1634
Nondestructive methods of controlling the surface nanorelief by the example of sapphire substrates V. E. AsadchikovA. V. ButashinV. A. Fedorov OriginalPaper 09 December 2009 Pages: 1635 - 1639
X-ray reflectometry of nanocomposite metal-dielectric films A. P. PetrakovL. N. KotovA. V. Sitnikov OriginalPaper 09 December 2009 Pages: 1640 - 1642
Measurement uncertainty in quantitative chemical analysis: Problems of the transition period G. R. Nezhikhovskii OriginalPaper 09 December 2009 Pages: 1643 - 1647
Standard samples and metrological traceability in chemistry I. E. Dobrovinskii OriginalPaper 09 December 2009 Pages: 1648 - 1651
Evaluation of adequacy of quantitative laboratory chemical analysis techniques V. I. Paneva OriginalPaper 09 December 2009 Pages: 1652 - 1657
Computerization in the development of quality control system for analytical laboratories: State of the art and prospects V. I. Dvorkin OriginalPaper 09 December 2009 Pages: 1658 - 1663
