Abstract
In this paper, the implantation-decay method is introduced to study the \(\beta \)-delayed charged particle decay. A silicon detector array was used for the implantation of the incident beams and for the detection of the emitted particles. An experimental measurement on the \(\beta \)-delayed particle emission from \(^{22}\)Al was used to demonstrate the method. The half-life value, charged particle spectroscopy, \(\gamma \) ray spectrum, and \(\gamma \) particle coincidence for the decay process were obtained and compared with previous experimental results for \(^{22}\)Al. The results show that the implantation-decay method, using a silicon detector array, is a suitable experimental method to study the \(\beta \)-delayed charged particle decay for proton-rich nuclei.
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This work was partially supported by the National Key R&D Program of China under Contract No. 2018YFA0404404 and the National Natural Science Foundation of China under Contract Nos. 11421505, 11475244, and 11175231.
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Wang, YT., Fang, DQ., Xu, XX. et al. Implantation-decay method to study the \(\beta \)-delayed charged particle decay. NUCL SCI TECH 29, 98 (2018). https://doi.org/10.1007/s41365-018-0438-5
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DOI: https://doi.org/10.1007/s41365-018-0438-5