Abstract
This study discussed the development of a series of new lead-free Sn-Mg solders by incorporating varying amounts of Mg (0.8, 1.5 and 2.5 wt. %) into pure Sn using disintegrated melt deposition technique followed by room temperature extrusion. All extruded Sn and Sn-Mg solder samples were characterized. Microstructural characterization studies revealed equiaxed grain morphology, minimal porosity and relatively uniform distribution of secondary phase. Better coefficient of thermal expansion was observed for Sn-2.5Mg sample when compared to conventional Sn-37Pb solder. Melting temperature of Sn-1.5Mg was found to be 212°C which is much lower than the conventional Sn-Ag-Cu or Sn-Cu (227°C) solders. Microhardness was increased with increasing amount of Mg in pure Sn. Room temperature tensile test results revealed that newly developed Sn-Mg solders exhibit enhanced strengths (0.2% yield strength and ultimate tensile strength) with comparable (if not better) ductility when compared to other commercially available and widely used Sn-based solder alloys.
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References
K. N. Subramanian and J. G. Lee, JOM 55, 26 (2003).
R. A. Fournelle, JOM 55, 49 (2003).
S. M. L. Nai, J. Wei, and M. Gupta, Mater. Sci. Eng. A 423, 166 (2006).
M. Abtew and G. Selvaduray, Mater. Sci. Eng. R. Reports 27, 95 (2000).
M. E. Alam, S. M. L. Nai, and M. Gupta, J. Alloys Comp. 476, 199 (2009).
O. A. Ogunseitan, JOM 59, 12 (2007).
California Department of Toxic Substances (Sacramento, CA), Electronic Hazardous Waste, www.dtsc.ca.gov/HazardousWaste/ EWaste/(2007), Last accessed on 20 September 2012.
Restriction of Hazardous Substances Directive (RoHS) from different perspectives http://www.mel.nist.gov/msid/SSP/standard_landscape/RoHS_analysis.html Last accessed 20 September 2012.
J. L. Freer and Jr. J. W. Morris, J. Electron. Mater. 21, 647 (1992).
M. Hansen and K. Anderko, Constitution of Binary Alloys, p. 55, McGraw-Hill, New York (1958).
F. Hua and J. Glazer, Proc. of 1997 TMS Annual Meeting and Exhibition on Design and Reliability of Lead-Free Solders and Solder Interconnects (eds. R. K. Mahidhara, D. R. Frear, S. M. L. Sastry, K. L. Liaw, and W. L. Winterbottom), p. 65, The Minerals, Metals and Materials Society, Warrendale, PA, USA (1997).
J. Glazer, Int. Mater. Rev. 40, 65 (1995).
Solid State Technology, http://ap.pennnet.com/display_article/289102/36/ARCHI/none/none/1/Raw_Materials-Pressure-Solder-Surcharge (2007) Last assessed 20 September 2012.
Solid State Technology, http://smt.pennnet.com/Articles/Article_Display.cfm?ARTICLE_ID=291515&p=35&pc=ENL (2007), Last assessed 20 September 2012.
Cost of Lead-Free Solder Materials: A research report by the IPC Solder Products Value Council. http://www.adhesivesmag.com. Last assessed 20 September 2012.
http://www.kitcometals.com/charts/. Last assessed 20 September 2012.
W. Gibson, S. Choi, T. R. Bieler, and K. N. Subramanian, Proceedings of the 1997 IEEE International Symposium on Electronics and the Environment, p. 246, San Francisco, USA (1997).
S. Lu, F. Luo, J. Chen, and B. Wang, Proc. International Conference on Electronic Packaging Technology & High Density Packaging, ICEPT-HDP (eds. K. Bi and F. Xiao), p. 1, IEEE Conference Publications, Shanghai, China (2008).
P. Wu and K. W. Bai, US Patent 6824039 (2004).
K. F. Ho, M. Gupta, and T. S. Srivatsan, Mater. Sci. Eng. A 369, 302 (2004).
R. A. Karnesky, L. Meng, and D. C. Dunand, Acta Mater. 55, 1299 (2007).
S. M. L. Nai, J. Wei, and M. Gupta, J. Electron. Mater. 37, 515 (2008).
K. D. Kim and D. D. L. Chung, J. Electron. Mater. 31, 933 (2002).
F. Guo, J. G. Lee, T. Hogan, and K. N. Subramanian, J. Mater. Res. 20, 364 (2005).
P. E. Gise and R. Blanchard, Semiconductor and Integrated Circuit Fabrication Techniques, p. 21, Reston Pub. Co, Reston, VA (1979).
J. R. Devis, P. Allen, S. R. Lampman, T. B. Zorc, S. D. Henry, J. L. Daquila, A. W. Ronke, J. Jakel, and K. L. O’Keefe, Properties and Selection: Nonferrous Alloys and Special-Purpose Materials, p. 1132, Formarly tenth edition, ASM Handbook, Vol. 2, ASM, Metal Park, Ohio (1993).
Technical data sheet, Qualitek Group of Companies, Qualitek, Singapore, www.qualitek.com. Last assessed 20 September 2012.
D. Lin, G. X. Wang, T. S. Srivatsan, M. Al-Hajri, and M. Petraroli, Mater. Lett. 53, 333 (2002).
J. L. Marshal and J. Calderon, Soldering Surf. Mount Technol. 26, 22 (1997).
H. Baker, Alloy Phase Diagrams, p. 283, Formarly Tenth Edition, ASM Handbook, Vol. 3, ASM, Metal Park, Ohio, (1993).
H. S. Kim, D. S. Suhr, G. H. Kim, and D. W. Kum, Met. Mater. Int. 2, 15 (1996).
R. H. Short and G. P. Evans, Assem. Eng. 31, 44 (1988).
W. D. Callister, Materials Science and Engineering: An Introduction, p. 174, 6th ed., Wiley, Malaysia (2007).
G. F. Bocchinni, The Int. J. Powder Metallurgy 22, 185 (1986).
M. Morishita and V. Koyama, J. Alloy. Compd. 398, 12 (2005).
G. E. Dieter, Mechanical Metallurgy, p. 191, 2nd Edition, McGraw-Hill, Inc., USA (1976).
S. M. L. Sastry, D. R. Frear, G. Kuo, and K. L. Jerina, Proc. Mechanics of Solder Wetting and Spreading (eds. F. G. Yost, F. M. Hosking, and D. R. Frear), p. 299, Van Nostrand, New York (1993).
D. C. Lin, S. Liu, T. M. Guo, G. X. Wang, T. S. Srivatsan, and M. Petraroli, Mater. Sci. Eng. A 360, 285 (2003).
M. Kouzeli and A. Mortensen, Acta Mater. 50, 39 (2002).
S. F. Hassan and M. Gupta, Mater. Sci. Eng. A 425, 22 (2006).
X. L. Zhong and M. Gupta, J. Phys. D — Appl. Phys. 41, 095403 (2008).
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Alam, M.E., Gupta, M. Development of high strength Sn-Mg solder alloys with reasonable ductility. Electron. Mater. Lett. 9, 575–585 (2013). https://doi.org/10.1007/s13391-013-2168-5
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DOI: https://doi.org/10.1007/s13391-013-2168-5