Abstract
Optical properties of amorphous Se65−xAs35Sbx thin films with different compositions (x = 0, 2, 4, 6, 8 and 10 at%) deposited by evaporation technique have been investigated by measuring transmission (T) and reflection (R) in the wavelength range 400–2500 nm. An optical characterization method for uniform films based on Swanepoel’s method has been employed to extract the refractive index n and film thickness d, with high precision (better than 1%). The calculated thickness for all thin films was about 1 µm. In addition, the absorption coefficient was evaluated in the strong absorption region of T and R. The possible optical transition in these films is found to be allowed indirect transition with energy gap \(E_{g}^{\text{opt}}\) decreases from 1.72 to 1.53 eV with increasing Sb content at expense of Se. The chemical bond approach has been applied to explain the decrease of the optical gap with increasing Sb content. The dispersion and oscillator energies were analyzed using the concept of the single oscillator by Wemple and Di-Domenico. The nonlinear refractive index was calculated and found to be increase with increasing Sb content.
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P Toupin, L Brilland, J Trolès, J L Adam Opt. Mater. Exp. 2 1359 (2012)
D C Sati, A Dahshanc, P Sharma Appl. Mater. Today 17 142–158 (2019)
WH Kim, VQ Nguyen, LB Shaw, LE Busse, C Florea, DJ Gibson, et al. J. Non Cryst Solids 431 8–15 (2016)
V Sharma, S Sharda, N Sharma, S C Katyalc, P Sharma Prog. Solid State Chem. 54 31–44 (2019)
S Fayek, A Maged, M Balboul Vacuum 53 447 (1999)
E R Shaaban, I Kansal, M Shapaan, J M F Ferreira J. Thermal Anal. Calorm. 98 347 (2009)
P Sharma, N Sharma, S Sharda, S C Katyal, V Sharma Prog. Solid State Chem. 44 (4) 131–141 (2016)
E Akat, G Aktaş Philos. Magazine B 81 689 (2001)
Y Sawan, F Wakim, M El-Gabaly, M El-Rayess J. Non-Crystal. Solids 41 319 (1980)
C Corredor, I Quiroga, J Vazquez, J Galdon, P Villares, R Jimenez-Garay Mater. Lett. 42 229 (2000)
A Moharram, A Othman, H H Amer, A Dahshan J. Non-crystal. Solids 352 2187 (2006)
J Vázquez, C Wagner, P Villares, R Jiménez-Garay J. Non-crystal. Solids 235 548 (1998)
P Lopez-Alemany, J Vazquez, P Villares, R Jimenez-Garay Thermochim. Acta 374 73 (2001)
S H Wemple, M DiDomenico Phys. Rev. B 3 1338 (1971)
J Manifacier, J Gasiot, J Fillard J. Phys. E Sci. Instrum. 9 1002 (1976)
M El-Hagary, M Emam-Ismail, E Shaaban, A Al-Rashidi, S Althoyaib Mater. Chem. Phys. 132 581 (2012)
R Swanepoel J. Phys. E Sci. Instrum. 16 1214 (1983)
R Swanepoel J. Phys. E Sci. Instrum. 17 896 (1984)
E R Shaaban, G Abbady, E S Yousef, G A M Ali, S A Mahmoud, N Afify Optoelectron. Adv. Mater. Rapid Commun. 13 235 (2019)
E Shaaban Mater. Chem. Phys. 100 411 (2006)
R Vahalová, L Tichý, M Vlček, H Tichá Phys. Status Solidi (A) 181 199 (2000)
E R Shaaban et al. Optik 164 527 (2018)
C Chen et al. Appl. Phys. Lett. 107 043905 (2015)
G A M Ali, O A Fouad, S A Makhlouf J. Alloys Compounds 579 606 (2013)
F Urbach Phys. Rev. 92 1324 (1953)
E R Shaaban, M Y Hassaan, M Moustafa, A Qasem, G A M Ali Optik 186 275 (2019)
T S Moss Butterworth, London (1959).
D Gosain, T Shimizu, M Ohmura, M Suzuki, T Bando, S Okano J. Mater. Sci. 26 3271(1991)
E R Shaaban, M El-Hagary, E S Moustafa, H S Hassan, Y A M Ismail, M Emam-Ismail, A S Ali Appl. Phys. A 122 20 (2015)
D. C. Sati, S. C. Katyal, P. Sharma IEEE Trans. Electron. Dev. 63(2) 698–703 (2016)
S Wemple Phys. Rev. B 7 3767 (1973)
M M Malik, M Zulfequar, A Kumar, M Husain J. Phys. Condensed Matter 4 8331(1992)
P Sharma, S Katyal J. Appl. Phys. 107 113527 (2010)
H Ticha, L Tichy J. Optoelectron. Adv. Mater. 4 381 (2002)
C C Wang Phys. Rev. B 2 2045 (1970)
E R Shaaban et al. J. Am. Ceramic Soc. 102 4067 (2019)
Acknowledgment
The authors thank the Deanship of Scientific Research at King Khalid University (KKU) for funding this research project, Number: (R.G.P2./62/40) under research center for advanced material science. Both Assiut University and Al-Azhar University have also acknowledged.
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Gadalla, A., Anas, F.A., Qasem, A. et al. Optical constants and dispersion parameters of amorphous Se65−xAs35Sbx thick films for optoelectronics. Indian J Phys 95, 1853–1863 (2021). https://doi.org/10.1007/s12648-020-01848-7
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DOI: https://doi.org/10.1007/s12648-020-01848-7