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Relevance of Dimensional Metrology in Manufacturing Industries

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Abstract

Measurement is the most fundamental concept of science and technology that leads to innovations. As per the general concept, measurement is just a tool to determine quantity, whereas in reality, measurement is a fundamental aspect to control and improve various parameters associated with different technical affairs. In the present scenario, the manufacturing of extremely complexed products needs high quality control to meet the design specifications, desired functional outcomes and norm compliances. In industrial manufacturing, the main objective is quality control by eliminating errors and improving the process by precision dimensional measurement methods/devices and following standards and recommended guidelines. Precision and traceable dimensional metrology caters the industry needs ranging from macro-engineering applications to nanotechnology and helps in supporting the objective “make it right in the first time” and hence has become an inextricable part of the advance manufacturing industry.

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References

  1. Y. Qin, A. Brockett, Y. Ma, A. Razali, J. Zhao, C. Harrison, W. Pan, X. Dai and D. Loziak, Micro-manufacturing: research, technology outcomes and development issues, Int. J. Adv. Manuf. Technol., 47 (2010), 821–837

    Article  Google Scholar 

  2. G.N. Peggs, Transactions on Engineering Sciences, WIT Press, 2001, ISSN 1743-3533, UK

  3. H.N. Hansen, K. Carneiro, H. Haitjema and L. De Chiffre, Dimensional micro and nano metrology, Ann. CIRP, 55 (2006), 721–743

    Article  Google Scholar 

  4. G. Wilkening and H. Bosse, Nano- and micrometrology – State-of-the-art and future challenges, MAPAN-J. Metrol. Soc India, 20 (2005), 125–151

    Google Scholar 

  5. E.B. Brousseau, S.S. Dimov, D.T. Pham, Some recent advances in multi-material micro- and nano-manufacturing, Int. J. Adv. Manuf. Technol., 47 (2010), 161–180

    Article  Google Scholar 

  6. V Srinivasan, Standardizing the specification, verification, and exchange of product geometry: Research, status and trends, Comput. Aided Des., 40 (2008), 738–749.

    Article  Google Scholar 

  7. M. Bahrawi, N. Fareed, Application of a commercially available displacement measuring interferometer to line scale measurement and uncertainty of measurement, MAPAN-J. Metrol. Soc India, 25 (2010), 261–266

    Google Scholar 

  8. K.J. Stout, M.N. Durakbasa and P.H. Osanna, Quality assurance - Have we specified it the wrong way around?, WEAR, 5/6 (2009), 511–514

    Article  Google Scholar 

  9. A. Weckenmann, P. Kraemer, J. Hoffmann, Manufacturing metrology –State of art and prospects, Proc. ISMQC, Madras INDIA (2007), 1–8.

  10. H. Kunzman, T. Pfeifer, R. Schmitt, H. Schwenke and A. Weckenmann, Productive metrology – adding value to manufacture, CIRP Ann. Manuf. Technol., 54 (2005), 155–168.

    Article  Google Scholar 

  11. https://www.unido.org/role-measurement-and-calibration-manufacture-products-global-market-guide-small-and-medium-sized-enterprises (Accessed in May 2018)

  12. I. Cristofolini, S. Filippi and C. Bandera, The role of product feature relations in a knowledge based methodology to manage design modifications for product measurability, Int. J. Prod. Res., 47 (2009), 2373–2389

    Article  Google Scholar 

  13. Y. Zhao, X. Xu, T. Kramer, F. Proctor and J. Horst, Dimensional metrology interoperability and standardization in manufacturing systems, Comput. Stand. Interfaces, 33 (2011), 541–555.

    Article  Google Scholar 

  14. Y. Hong and T. Chang, A comprehensive review of tolerancing research. Int. J. Prod. Res., 40 (2002), 2425–2459.

    Article  MATH  Google Scholar 

  15. A.K. Srivastava, Role of NPL-India in nanotechnology and nanometrology, MAPAN-J. Metrol. Soc India, 28 (2013), 263–272

    Google Scholar 

  16. T. J. B. M. Janssen and D. Roy, Nano-science and nano-metrology for societal benefits, MAPAN-J. Metrol. Soc India, 28 (2013), 237–238

    Google Scholar 

  17. R. J. Lazos-Martı´nez and N. Gonza´lez-Rojano, Nanometrology in emerging economies: the case of Mexico, MAPAN-J. Metrol. Soc India, 28 (2013), 299–309

  18. X. Jiang and D. J. Whitehouse, Precision metrology, Phil. Trans. R. Soc. A, 370 (2012), 4154–4160

    Article  ADS  Google Scholar 

  19. http://www.nplindia.in/ (Accessed in June 2018)

  20. https://www.bipm.org/utils/common/documents/jcgm/JCGM_200_2012.pdf (Accessed in June 2018)

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Acknowledgements

Authors are thankful to Director, National physical laboratory for his constant support and continuous motivation to write this article.

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Authors and Affiliations

  1. CSIR-National Physical Laboratory, Dr. K. S. Krishnan Marg, New Delhi, 110012, India

    Girija Moona, Mukesh Jewariya & Rina Sharma

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  1. Girija Moona
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  2. Mukesh Jewariya
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  3. Rina Sharma
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Correspondence to Girija Moona.

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Moona, G., Jewariya, M. & Sharma, R. Relevance of Dimensional Metrology in Manufacturing Industries. MAPAN 34, 97–104 (2019). https://doi.org/10.1007/s12647-018-0291-3

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