Skip to main content
Log in

Numerical Study on the Effect of Water-cooling Jacket Radius on Czochralski Silicon

  • Research
  • Published:
Silicon Aims and scope Submit manuscript

Abstract

In order to create a suitable temperature environment in the cooling process of Czochralski silicon (Cz-Si), a water-cooling jacket is usually set, which can improve the crystal temperature gradient and the crystal cooling rate. In this paper, a 2D global quasi-steady axisymmetric model is established to simulate the effects of water-cooling jacket radius of the melt flow and heat transfer, solid–liquid (S-L) interface shape and crystal thermal stress during the silicon crystal growth process. The results show that changing the radius of the water-cooling jacket has less effect on the melt flow, but more significant effect on the crystal heat transfer. The smaller the radius of the water-cooling jacket, the higher the argon flow rate nearby, the better the cooling effect, it will reduce the convexity of the S-L interface and the thermal stress. According to the calculation results, compared with ΔR = 35 mm and 55 mm, the crystal pulling rate of ΔR = 15 mm can be increased by 27.1% and 36.1% respectively.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

Data Availability

All data generated or analyzed during this study are included in this published article.

Code availability

Not applicable.

The authors wish to acknowledge the financial support on this research from the Key Research and Development Program of Jiangsu Province of China (grant no. BE2019009-003), Industry–University Research Project (Wuxi Suntech Solar Power Co., Ltd., grant no. 8421130025), and the National Natural Science Foundation for Young Scholars of China (grant no. 51206069).

References

  1. Czochralski J (1918) Ein Verfahren zur Messung der Kristallisatiorsgeschwindigkeit der Metalle. Z Anal Chem 57(8):373–374. https://doi.org/10.1007/BF01473047

    Article  Google Scholar 

  2. Uecker R (2014) The historical development of the Czochralski method. J Cryst Growth 401:7–24. https://doi.org/10.1016/j.jcrysgro.2013.11.095

    Article  CAS  Google Scholar 

  3. Jeon H, Park H, Koyyada G et al (2020) Optimal Cooling System Design for Increasing the Crystal Growth Rate of Single-Crystal Silicon Ingots in the Czochralski Process Using the Crystal Growth Simulation. Processes 8:1077. https://doi.org/10.3390/pr8091077

    Article  CAS  Google Scholar 

  4. Voronkov V (1982) The mechanism of swirl defects formation in silicon. J Cryst Growth 59(3):625–643. https://doi.org/10.1016/0022-0248(82)90386-4

    Article  CAS  Google Scholar 

  5. Huang X, Taishi T, Wang T et al (2001) Measurement of temperature gradient in Czochralski silicon crystal growth. J Cryst Growth 229(1):6–10. https://doi.org/10.1016/S0022-0248(01)01040-5

    Article  CAS  Google Scholar 

  6. Mukaiyama Y, Sueoka K, Maeda S et al (2020) Numerical analysis of effect of thermal stress depending on pulling rate on behavior of intrinsic point defects in large-diameter Si crystal grown by Czochralski method. J Crystal Growth 531:125334. https://doi.org/10.1016/j.jcrysgro.2019.125334

    Article  CAS  Google Scholar 

  7. Tsukada T, Hozawa M, Imaishi N (1990) Effect of a radiation shield on thermal stress field during Czochralski crystal growth of silicon. J Chem Eng Jpn 23:186–191. https://doi.org/10.1252/jcej.23.186

    Article  CAS  Google Scholar 

  8. Song D, Lee S, Mun H et al (2011) Oxygen content increasing mechanism in Czochralski (CZ) silicon crystals doped with heavy antimony under a double-typed heat shield. J Cryst Growth 325(1):27–31. https://doi.org/10.1016/j.jcrysgro.2011.04.020

    Article  CAS  Google Scholar 

  9. Zhang J, Liu D, Zhao Y et al (2014) Impact of heat shield structure in the growth process of Czochralski silicon derived from numerical simulation. Chin J Mechanic Eng 27(3):504–510. https://doi.org/10.3901/CJME.2014.03.504

    Article  CAS  Google Scholar 

  10. Rojo C, Diéguez E, Derby J (1999) A heat shield to control thermal gradients, melt convection, and interface shape during shouldering in Czochralski oxide growth. J Cryst Growth 200(1):329–334. https://doi.org/10.1016/S0022-0248(98)01250-0

    Article  Google Scholar 

  11. Prostomolotov A, Verezub N, Mezhennii M et al (2011) Thermal optimization of CZ bulk growth and wafer annealing for crystalline dislocation-free silicon. J Cryst Growth 318(1):187–192. https://doi.org/10.1016/j.jcrysgro.2010.11.080

    Article  CAS  Google Scholar 

  12. Friedrich J, Jung T, Trempa M et al (2019) Considerations on the limitations of the growth rate during pulling of silicon crystals by the Czochralski technique for PV applications. J Crystal Growth 524:125168. https://doi.org/10.1016/j.jcrysgro.2019.125168

    Article  CAS  Google Scholar 

  13. Sim B, Jung Y, Lee H (2009) Effect of the Ingot Cooling on the Grown-in Defects in Silicon Czochralski Growth. Jpn J Appl Phys 48(10R):105503. https://doi.org/10.1143/JJAP.48.105503

    Article  CAS  Google Scholar 

  14. Zhao W, Liu L (2017) Control of heat transfer in continuous-feeding Czochralski-silicon crystal growth with a water-cooled jacket. J Cryst Growth 458:31–36. https://doi.org/10.1016/j.jcrysgro.2016.10.041

    Article  CAS  Google Scholar 

  15. Qi X, Wang J, Wen Y et al (2023) Effect of water-cooled jacket on the oxygen transport during the Czochralski silicon crystal growth process. J Crystal Growth 609:127139. https://doi.org/10.1016/j.jcrysgro.2023.127139

    Article  CAS  Google Scholar 

  16. Jung T, Seebeck J, Friedrich J (2013) Combined global 2D–local 3D modeling of the industrial Czochralski silicon crystal growth process. J Cryst Growth 368:72–80. https://doi.org/10.1016/j.jcrysgro.2013.01.026

    Article  CAS  Google Scholar 

  17. Lan C (2004) Recent progress of crystal growth modeling and growth control. Chem Eng Sci 59(7):1437–1457. https://doi.org/10.1016/j.ces.2004.01.010

    Article  CAS  Google Scholar 

  18. Qi X, Ma W, Dang Y et al (2020) Optimization of the melt/crystal interface shape and oxygen concentration during the Czochralski silicon crystal growth process using an artificial neural network and a genetic algorithm. J Crystal Growth 548:125828. https://doi.org/10.1016/j.jcrysgro.2020.125828

    Article  CAS  Google Scholar 

Download references

Funding

The Project is supported by Key Research and Development Program of Jiangsu Province of China (Grant No. BE2019009-003), Industry-University-Research Project (Wuxi Suntech Solar Power Co., Ltd. Grant No. 8421130025). The National Natural Science Foundation for Young Scholars of China (Grant No. 51206069).

Author information

Authors and Affiliations

Authors

Contributions

Wenjia Su contributed to the conception of the study. Jiaqi Li and Jiulong Li performed the simulation and contributed significantly to analysis and manuscript written. Zhen Zhang performed the data analyses and modified the manuscript. Zhicheng Guan helped perform the analysis with constructive discussion.

Corresponding author

Correspondence to Wenjia Su.

Ethics declarations

Competing interests

The authors declare no competing interests.

Conflict of interest

There are no conflicts of interest.

Ethics approval

Not applicable.

Consent to participate

The consent was obtained from individual or guardian participants.

Consent for publication

That all authors have checked the manuscript and have agreed to the submission.

Additional information

Publisher's Note

Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.

Rights and permissions

Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Su, W., Li, J., Li, J. et al. Numerical Study on the Effect of Water-cooling Jacket Radius on Czochralski Silicon. Silicon 15, 5307–5315 (2023). https://doi.org/10.1007/s12633-023-02430-6

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s12633-023-02430-6

Keywords

Navigation