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Stacking faults and microstructural parameters in non-mulberry silk fibres

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Abstract

We have analysed the broadening of X-ray reflections observed in nonmulberry silk fibres in terms of stacking faults and microstructural parameters using a single-order method and have, with these parameters, developed, for the first time, a procedure to compute the whole pattern of these silk fibres. The essential deviations in the values of microstructural parameters obtained from line profile and whole pattern fitting procedures are discussed in this paper.

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Authors and Affiliations

  1. Department of Studies in Physics, University of Mysore, Manasagangotri, Mysore, 570 006, India

    S. Divakara & R. Somashekar

  2. Instrumentation Division, Central Electrochemical Research Institute, Karaikudi, 630 006, India

    S. Madhu

Authors
  1. S. Divakara
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  2. S. Madhu
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  3. R. Somashekar
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Correspondence to R. Somashekar.

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Divakara, S., Madhu, S. & Somashekar, R. Stacking faults and microstructural parameters in non-mulberry silk fibres. Pramana - J Phys 73, 927–938 (2009). https://doi.org/10.1007/s12043-009-0159-8

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  • DOI: https://doi.org/10.1007/s12043-009-0159-8

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