Abstract
The dielectric and ferroelectric characteristics of Bi0.5Na0.5TiO3 (BNT), CaCu3Ti4O12 (CCTO), and 0.5Bi0.5Na0.5TiO3–0.5CaCu3Ti4O12 (BNT/CCTO) ceramics are compared. X-ray diffraction patterns confirmed the formation of single phase of all the ceramics after sintering at 950°C for 15 h. Scanning electron microscopy images of the sintered ceramics reveal average grain sizes in the range from 200 nm to 2.5 μm. Energy-dispersive x-ray mapping and x-ray photoelectron spectroscopy show the presence of the elements Bi, Na, Ca, Cu, Ti, and O with uniform distribution in the ceramics. BNT/CCTO exhibits high dielectric constant (ε r ∼ 6.9 × 104) compared with BNT (ε r ∼ 0.13 × 104) and CCTO (ε r ∼ 1.68 × 104) ceramics at 1 kHz and 503 K. The high dielectric constant of BNT/CCTO compared with BNT and CCTO is associated with a major contribution from grain boundaries, as confirmed by impedance and modulus analyses. The P–E hysteresis loop of all the ceramics measured at room temperature and 50°C exhibited typical ferroelectric nature. The remanent polarization (P r) of BNT (1.58 μC/cm2) and CCTO (0.654 μC/cm2) ceramics are higher than that of BNT/CCTO (0.267 μC/cm2) ceramic.
Graphical Abstract
References
R. Xue, D. Liu, Z. Chen, H. Dai, J. Chen, and G. Zhao, J. Electron. Mater. 44, 1088 (2015).
E.J.J. Mallmann, M.A.S. Silva, A.S.B. Sombra, M.A. Botelho, S.E. Mazzetto, A.S.D. Menezes, A.F.L. Almeida, and P.B.A. Fechine, J. Electron. Mater. 44, 295 (2015).
M.H. Wang, B. Zhang, and F. Zhou, J. Electron. Mater. 43, 2607 (2014).
L. Singh, U.S. Rai, K.D. Mandal, and N.B. Singh, Prog. Cryst. Growth Charact. Mater. 60, 15 (2014).
L. Singh, U.S. Rai, K.D. Mandal, B.C. Sin, S.I. Lee, and Y. Lee, Ceram. Int. 40, 10073 (2014).
I. Norezan, A.K. Yahya, and M.K. Talari, J. Mater. Sci. Technol. 28, 1137 (2012).
H. Yu, H. Liu, H. Hao, D. Luo, and M. Cao, Mater. Lett. 62, 1353 (2008).
C. Warangkanagool and G. Rujijanagul, Nanoscale Res. Lett. 7, 68 (2012).
L. Fang, M. Shen, and Z. Li, J. Appl. Phys. 100, 104101 (2006).
D. Lin, Q. Zheng, C. Xu, and K.W. Kwok, Appl. Phys. A 93, 549 (2008).
B. Parija, S.K. Rout, L.S. Cavalcante, A.Z. Simões, S. Panigrahi, E. Longo, and N.C. Batista, Appl. Phys. A 109, 715 (2012).
T. Takenaka, K.I. Maruyama, and K. Sakata, Jpn. J. Appl. Phys. 30, 2236 (1991).
W. Krauss, D. Schütz, F.A. Mautner, A. Feteira, and K. Reichmann, J. Eur. Ceram. Soc. 30, 1827 (2010).
A. Sasaki, T. Chiba, Y. Mamiya, and E. Otsuki, Jpn. J. Appl. Phys. 38, 5564 (1999).
T. Takenaka, K.O. Sakata, and K.O. Toda, Ferroelectrics 106, 375 (1990).
T. Wada, K. Toyoike, Y. Imanaka, and Y. Matsuo, Jpn. J. Appl. Phys. 40, 5703 (2001).
A.R. Darvishi, W.L. Li, O.S. Bishe, L.D. Wang, Y. Zhao, S.Q. Zhang, and W.D. Fei, J. Alloys Compd. 514, 179 (2012).
L. Singh, I.W. Kim, B.C. Sin, K.D. Mandal, U.S. Rai, A. Ullah, H. Chung, and Y. Lee, RSC Adv. 4, 52770 (2014).
L. Singh, U.S. Rai, and K.D. Mandal, Mater. Res. Bull. 48, 2117 (2013).
J.K. Reddy, B. Srinivas, V.D. Kumari, and M. Subrahmanyam, ChemCatChem 1, 492 (2009).
Y. Lee, T. Watanabe, T. Takata, J.N. Kondo, M. Hara, M. Yoshimura, and K. Domen, Chem. Mater. 17, 2422 (2005).
Z.H. Sun, C.H. Kim, H.B. Moon, Y.H. Jang, and J.H. Cho, J. Korean Phys. Soc. 54, 881 (2009).
L. Singh, I.W. Kim, W.S. Woo, B.C. Sin, H. Lee, and Y. Lee, Solid State Sci. 43, 35 (2015).
C.M. Guinness, J.E. Downes, P. Sheridan, P.A. Glans, K.E. Smith, W. Si, and P.D. Johnson, Phys. Rev. B 71, 195111 (2005).
E.R. Moore, P. Ferrari, D.E.D. Droguett, D. Lederman, and J.T. Evans, J. Appl. Phys. 111, 014108 (2012).
Y.J. Wu, S.H. Su, S.Y. Wu, and X.M. Chen, Ceram. Int. 37, 1979 (2011).
A.F.L. Almeida, P.B.A. Fechine, J.C. Góes, M.A. Valente, M.A.R. Miranda, and A.S.B. Sombra, Mater. Sci. Eng. 111, 113 (2004).
W.X. Yuan and S.K. Hark, J. Eur. Ceram. Soc. 32, 465 (2012).
Y. Yan, L. Jin, L. Feng, and G. Cao, Mater. Sci. Eng. 130, 146 (2006).
L. Singh, U.S. Rai, and K.D. Mandal, J. Alloys Compd. 555, 176 (2013).
H.E. Kim, S.M. Choi, S.Y. Lee, Y.W. Hong, and S.I. Yoo, Electron. Mater. Lett. 9, 325 (2013).
W. Li and R.W. Schwartz, Phys. Rev. B 75, 012104 (2007).
J.H. Park, J.S. Bae, B.C. Choi, J.H. Jeong, H.J. Seo, B.K. Moon, and I.W. Kim, Appl. Phys. A 79, 1879 (2004).
H. Borkar, V.N. Singh, B.P. Singh, M. Tomar, V. Gupta, and A. Kumar, RSC Adv. 4, 22840 (2014).
L. Singh, U.S. Rai, K.D. Mandal, and A.K. Rai, Appl. Phys. A 112, 891 (2013).
L. Fang, M. Shen, and D. Yao, Appl. Phys. A 80, 1763 (2005).
S.I.R. Costa, M. Li, J.R. Frade, and D.C. Sinclair, RSC Adv. 3, 7030 (2013).
Acknowledgements
This study was supported by the National Research Foundation (NRF-2015R1D1A3A01019167 to Y. Lee and NRF-2015R1D1A4A01019630 to L. Singh) and the Priority Research Centers Program (NRF-2009-0093818) funded by the Ministry of Education, Republic of Korea.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Singh, L., Yadava, S., Sin, B. . et al. Comparative Dielectric and Ferroelectric Characteristics of Bi0.5Na0.5TiO3, CaCu3Ti4O12, and 0.5Bi0.5Na0.5TiO3–0.5CaCu3Ti4O12 Electroceramics. J. Electron. Mater. 45, 2662–2672 (2016). https://doi.org/10.1007/s11664-016-4340-9
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s11664-016-4340-9