Abstract
The formation and growth of intermetallics at the interface between Sn-Ag-(Cu) alloy balls and Au/Ni-6P plating were experimentally examined as a function of soldering period. Joint strengths were also evaluated by a ball pull test. For the joint with Sn-3.5Ag, the primary reaction product of Ni3Sn4 exhibits growth and shrinkage in thickness repeatedly with a passage of reaction time up to 30 min, while the Ni3SnP reaction layer monotonously increases its thickness without fluctuation. In the cases of the joints with Cu bearing solder, Sn-3Ag-0.5Cu and Sn-3.5Ag-0.8Cu, a single η-(Cu,Ni)6Sn5 interface layer grows by fast Cu segregation from liquid solder to the interface layer on soldering. For all the soldered joints, a P-rich layer appears at the surface region of a Ni-6P plating layer by Ni depletion to form those intermetallic compounds at interfaces. The growth rate of a P-rich layer for Sn-3.5Ag is faster by about 4–8 times than those of the Sn-Ag-Cu. The presence of Cu in solder enhances the formation of the Cu6Sn5 intermetallic layer at the interface resulting in prevention of Ni diffusion to liquid solder. For all the soldered joints, coarsened reaction interfaces decrease the joint strengths.
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Hwang, CW., Suganuma, K., Kiso, M. et al. Influence of Cu addition to interface microstructure between Sn-Ag solder and Au/Ni-6P plating. J. Electron. Mater. 33, 1200–1209 (2004). https://doi.org/10.1007/s11664-004-0123-9
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DOI: https://doi.org/10.1007/s11664-004-0123-9