Abstract
A joint between Sn95.5Ag4Cu0.5 (mass%) solder and an Ag/Pd thick film was soldered by dipping at 260°C for 3–30 sec. Shrinkage voids and Sn grain growth were characterized as well as their transformation kinetics. Void shrinkage occurred in the zone near the top surface of the joint. Shrinkage was always accompanied by colonies of ternary/quaternary meta-eutectic that were the regions solidified last in the joint. The Sn grains accumulated into two bands across the joint during solidification: one was transverse through the thickness and the other was parallel to the solder pad.
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Tian, D., Kutilainen, T. Microstructures in solder joints between Sn95.5Ag4Cu0.5 solder and Ag/Pd thick film. J. Electron. Mater. 32, 152–158 (2003). https://doi.org/10.1007/s11664-003-0186-z
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DOI: https://doi.org/10.1007/s11664-003-0186-z