Abstract
Electron backscatter diffraction was used to reveal high- and low-angle grain boundaries (HAGBs, with misorientation ≥15 deg, and LAGBs, <15 deg) in pure titanium (ASTM grade 2) subjected to equal channel angular pressing. Comprehensive paradigms were developed to present relations of yield strength vs HAGB grain diameter, and LAGB contribution vs LAGB linear intercept. Incorporating grain orientations (against loading axis) into the Hall–Petch relation, we quantitatively investigated the strength contributions by HAGBs and LAGBs, respectively.
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This study was supported by the Defence Materials Technology Centre (DMTC). The authors gratefully acknowledge the support of EBSD by Shanghai Jiaotong University. Our thanks are due to K. Xia and D.T. McDonald at the University of Melbourne and S.M. Zhu from Monash University for access to laboratory facilities and assistance with EBSD.
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Luo, P., Hu, Q. & Wu, X. Quantitatively Analyzing Strength Contribution vs Grain Boundary Scale Relation in Pure Titanium Subjected to Severe Plastic Deformation. Metall Mater Trans A 47, 1922–1928 (2016). https://doi.org/10.1007/s11661-016-3391-0
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DOI: https://doi.org/10.1007/s11661-016-3391-0