Skip to main content
SpringerLink
Log in

Determination of residual stress distribution combining slot milling method and finite element approach

  • Article
  • Published:
Science China Technological Sciences Aims and scope Submit manuscript

Abstract

Residual stress plays a vital role in the structural strength and stability. The determination of residual stress at single-point has become mature at present. However, the method to determine residual stress distribution is still in shortage. For this problem, a finite element approach combined with slot milling method was developed in this study. In the method, firstly a slot is milled on the specimen surface to release the residual stress and then the released displacement field is measured by optical method, such as digital image correlation (DIC), finally the finite element approach is used to determine the residual stress distribution along the slot. In order to verify the feasibility of the method, it was applied to study the residual stress introduced by shot peening, mainly about the stress distribution along the direction vertical to the shot peened surface. Since the influence depth of shot peening was too small, we utilized focused ion beam (FIB) to determine the microscale residual stress distribution. The result measured by X-ray diffraction (XRD) demonstrated that the method was feasible to determine the residual stress distribution.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. James M N. Residual stress influences on structural reliability. Eng Failure Anal, 2011, 18: 1909–1920

    Article  Google Scholar 

  2. Ma C H, Huang J H, Chen H. Residual stress measurement in textured thin film by grazing-incidence X-ray diffraction. Thin Solid Films, 2002, 418: 73–78

    Article  Google Scholar 

  3. Kang Y, Qiu Y, Lei Z, et al. An application of Raman spectroscopy on the measurement of residual stress in porous silicon. Opt Lasers Eng, 2005, 43: 847–855

    Article  Google Scholar 

  4. Choi H C, Park J H. Prediction of residual stress distribution in multi-stacked thin film by curvature measurement and iterative FEA. J Mater Sci Technol, 2005, 19: 1065–1071

    Google Scholar 

  5. Winiarski B, Gholinia A, Tian J, et al. Submicron-scale depth profiling of residual stress in amorphous materials by incremental focused ion beam slotting. Acta Mater, 2012, 60: 2337–2349

    Article  Google Scholar 

  6. Schajer G S. Advances in hole-drilling residual stress measurements. Exp Mech, 2010, 50: 159–168

    Article  Google Scholar 

  7. Zhu R H, Xie H M, Zhu J G, et al. A micro-scale strain rosette for residual stress measurement by SEM Moiré method. Sci China Phys Mech Astron, 2014, 57: 716–722

    Article  Google Scholar 

  8. Schajer G S. Use of displacement data to calculate strain gauge response in non-uniform strain fields. Strain, 1993, 29: 9–13

    Article  Google Scholar 

  9. Barsanti M, Beghini M, Bertini L. First-order correction to counter the effect of eccentricity on the hole-drilling integral method with straingage rosettes. J Strain Anal Eng Des, 2016, 51: 431–444

    Article  Google Scholar 

  10. Winiarski B, Withers P J. Micron-scale residual stress measurement by micro-hole drilling and digital image correlation. Exp Mech, 2012, 52: 417–428

    Article  Google Scholar 

  11. Zhu R, Xie H, Dai X, et al. Residual stress measurement in thin films using a slitting method with geometric phase analysis under a dual beam (FIB/SEM) system. Meas Sci Technol, 2014, 25: 095003

    Article  Google Scholar 

  12. Sabaté N, Vogel D, Gollhardt A, et al. Digital image correlation of nanoscale deformation fields for local stress measurement in thin films. Nanotechnology, 2006, 17: 5264

    Article  Google Scholar 

  13. Kim K, Jung H. Nondestructive testing of residual stress on the welded part of butt-welded A36 plates using electronic speckle pattern interferometry. Nucl Eng Technol, 2016, 48: 259–267

    Article  Google Scholar 

  14. Kang K J, Yao N, He M Y, et al. A method for in situ measurement of the residual stress in thin films by using the focused ion beam. Thin Solid Films, 2003, 443: 71–77

    Article  Google Scholar 

  15. Winiarski B, Langford R M, Tian J, et al. Mapping residual stress distributions at the micron scale in amorphous materials. Metall Mat Trans A, 2010, 41: 1743–1751

    Article  Google Scholar 

  16. Mansilla C, Ocelík V, De Hosson J T M. Local residual stress measurements on nitride layers. Mater Sci Eng A, 2015, 636: 476–483

    Article  Google Scholar 

  17. Lunt A J G, Korsunsky A M. A review of micro-scale focused ion beam milling and digital image correlation analysis for residual stress evaluation and error estimation. Surface Coatings Technol, 2015, 283: 373–388

    Article  Google Scholar 

  18. Lecompte D, Sol H, Vantomme J, et al. Identification of elastic orthotropic material parameters based on ESPI measurements. In: SEM annual conference and exposition on experimental and applied mechanics. Portland, 2005

    Google Scholar 

  19. Torres M. An evaluation of shot peening, residual stress and stress relaxation on the fatigue life of AISI 4340 steel. Int J Fatigue, 2002, 24: 877–886

    Article  Google Scholar 

  20. Zhang P, Lindemann J. Influence of shot peening on high cycle fatigue properties of the high-strength wrought magnesium alloy AZ80. Scripta Mater, 2005, 52: 485–490

    Article  Google Scholar 

  21. Reyntjens S, Puers R. A review of focused ion beam applications in microsystem technology. J Micromech Microeng, 2001, 11: 287–300

    Article  Google Scholar 

  22. Chu T C, Ranson W F, Sutton M A. Applications of digital-imagecorrelation techniques to experimental mechanics. Exp Mech, 1985, 25: 232–244

    Article  Google Scholar 

  23. Zhu R, Xie H, Xue Y, et al. Fabrication of speckle patterns by focused ion beam deposition and its application to micro-scale residual stress measurement. Meas Sci Technol, 2015, 26: 095601

    Article  Google Scholar 

Download references

Author information

Author notes

  1. These authors contributed equally to this work

Authors and Affiliations

  1. Key Laboratory of Applied Mechanics, School of Aerospace Engineering, Tsinghua University, Beijing, 100084, China

    RongHua Zhu, Qi Zhang, HuiMin Xie & XingZhe Yu

  2. School of Aerospace Engineering, Beijing Institute of Technology, Beijing, 100081, China

    ZhanWei Liu

Authors
  1. RongHua Zhu
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Qi Zhang
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. HuiMin Xie
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. XingZhe Yu
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. ZhanWei Liu
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding authors

Correspondence to HuiMin Xie or ZhanWei Liu.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Zhu, R., Zhang, Q., Xie, H. et al. Determination of residual stress distribution combining slot milling method and finite element approach. Sci. China Technol. Sci. 61, 965–970 (2018). https://doi.org/10.1007/s11431-017-9131-0

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s11431-017-9131-0

Keywords

Search

Navigation